Inpa Systems, Inc.

Cadence Design Systems, Inc.

Verplex Systems, Inc.

Chioumin M Chang

Chih-Chang Lin

Thomas B Huang

Yung-Te Lai

Kung-Chien Chen

An integrated prototyping system (IPS) is proposed for verifying and validating an electronic system design (ESD) with hierarchical design elements (HDEs). The IPS has: a) A reprogrammable logic device (RPLD) having an emulation timing base and an RPLD-interface for programming and simulating HDEs under validation while transacting exchanging vectors. The RPLD is also switchably coupled to numerous external peripheral electronic devices (PED), b) An EDA simulator for simulating then verifying selected HDEs while transacting exchanging vectors. The EDA simulator also has a simulator interface; and c) An IPS controller bridging the RPLD and the EDA simulator. The IPS controller has an IPS executive for progressively verifying and validating the ESD. The IPS executive further includes a co-emulation software for jointly and simultaneously running the RPLD and the EDA simulator with an event-based synchronization scheme for interchanging exchanging vectors on demand between the RPLD and the EDA simulator.

Integrated prototyping system for validating an electronic system design

A method for prototyping and validating a customer's electronic system design (ESD) with design data is proposed. The design data is partitioned into hierarchical design elements (HDEs) plus their respective test benches. The ESD couples with customer's customer peripheral devices CPDs via their peripheral interface terminals PITs thus forming interconnected hierarchical system elements (HSEs) interacting with one another according to a functional validation specification. The HSEs form numerous system hierarchy levels (SHLs). The method includes:

Method of progressively prototyping and validating a customer's electronic system design

An equivalence checking method provides first and second logic functions. Don't care gates are inserted for don't care conditions in the first and second logic functions. The insertion of the don't care gates creates a first intermediate circuit and a second intermediate circuit. All 3DC gates of the first intermediate circuit are propagated and merged into a single 3DC gate when 3DC gates and SDC gates coexist in either of the first and second intermediate circuits. All 3DC gates of the second intermediate circuit are propagated and merged into a single 3DC gate when 3DC gates and SDC gates coexist in either of the first and second intermediate circuits. First and second circuit are produced in response to propagating and merging the 3DC gates. A combinational equivalence check is then performed of the first circuit to the second circuit under different equivalence relations.

Combinational equivalence checking methods and systems with internal don't cares

An equivalence checking method provides first and second logic functions. Don't care gates are inserted for don't care conditions in the first and second logic functions. The insertion of the don't care gates creates a first intermediate circuit and a second intermediate circuit. All 3DC gates of the first intermediate circuit are propagated and merged into a single 3DC gate when 3DC gates and SDC gates coexist in either of the first and second intermediate circuits. All 3DC gates of the second intermediate circuit are propagated and merged into a single 3DC gate when 3DC gates and SDC gates coexist in either of the first and second intermediate circuits. First and second circuits are produced in response to propagating and merging the 3DC gates. A combinational equivalence check is then performed of the first circuit to the second circuit under different equivalence relations.

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San Jose, CA, United States of America

Chioumin M Chang