Powerchip Semiconductor Manufacturing Corporation

Ching-Sung Ho

Ying-Tsung Chu

Ching-Kang Chiu

Juin Jei Liou

Jia-Horng Tsai

Feibo Du

Wenqiang Song

A silicon-controlled rectifier includes a substrate of a first conductivity type; a deep well region of a second conductivity type; a well regions of the first conductivity type and the second conductivity type; a first, second and third heavily doped active regions of the first conductivity type; a first, second and third heavily doped active regions of the second conductivity type; and a first, second and third shallow trench isolation structures. A reverse diode formed in the third heavily doped active region of the second conductivity type and the well region of the first conductivity type is embedded, and a forward diode is formed in the heavily doped active region of the first conductivity type and the well region of the second conductivity type. By sharing the third heavily doped active region of the second conductivity type across the well regions of different conductivity types, two back-to-back diodes are formed.

Silicon-controlled rectifier with back-to-back diodes

A dual-directional silicon-controlled rectifier includes: a substrate, a well region, a shallow trench isolation structure, heavily doped regions of a first conductive type, heavily doped regions of a second conductive type, and ESD implantations of the first conductive type. Four active regions are provided side by side in the well region. Forward and reverse SCRs and the ESD implantations are provided in the middle active regions. Forward and reverse diodes are provided in the active regions on both sides. One of the heavily doped regions of the first conductive type in contact with the ESD implantations is disposed between the SCRs and the diodes, so as to be electrically connected to a heavily doped region of the second conductive type of the diodes.

Dual-directional silicon-controlled rectifier

A semiconductor device including a substrate and a capacitor is provided. The capacitor includes a first electrode, a second electrode, and an insulating layer. The first electrode is located on the substrate. The first electrode has a plurality of hemispherical recesses. The second electrode is located on the first electrode. The insulating layer is located between the first electrode and the second electrode. Surfaces of the hemispherical recesses are in direct contact with the insulating layer.

Semiconductor device and manufacturing method thereof

A memory structure including a substrate, a memory cell, and a transistor is provided. The substrate includes a memory cell region and a peripheral circuit region. The memory cell is located in the memory cell region. The transistor is located in the peripheral circuit region. The transistor includes a gate, a first doped region, a second doped region, a first nickel silicide layer, and a second nickel silicide layer. The gate is located on the substrate and is insulated from the substrate. The first doped region and the second doped region are located in the substrate on two sides of the gate. The first nickel silicide layer is located on an entire top surface of the first doped region, and the second nickel silicide layer is located on an entire top surface of the second doped region.

Growing community of inventors

Taichung, Taiwan

Ching-Sung Ho