International Business Machines Corporation

Ching Lung Tong

Daniel Mark Dreps

Andreas H A Arp

Jason Lee Frankel

Chad Andrew Marquart

Douglas J Malone

Franklin M Baez

Lily Jielu Zhang

Roger Donell Weekly

Sungjun Chun

Tobias Webel

Timothy Michael Skergan

Lawrence D Curley

Ulrich Baur

Ralf Ludewig

Ronald J Frishmuth

A two-chip die module with minimal chip-to-chip clock skew is provided. The two-chip die module includes a common substrate, first and second chips operably disposed on the common substrate to be communicative in parallel with one another and a single phase lock loop (PLL). The PLL is disposed within one of the first and second chips to provide a source for a common clock signal for the first and second chips. PLL signals of the PLL to the first and second chips are nearly equal and clock sample signals of the first and second chips are nearly equal.

Phase aligning and calibrating clocks from one phase lock loop (PLL) for a two-chip die module

An integrated circuit chip includes a mainline function logic path communicatively connected to a first input/output (I/O) pin, a test logic path communicatively connected to the first I/O pin, a latch disposed between the communicative connection between the test logic function path and the first I/O pin, a second I/O pin communicatively connected to the latch, the second I/O pin operative to send a signal operative to change a state of the latch.

Integrated circuit arrangement for test inputs

A computer implemented method, testing system, computer usable program code, and apparatus are provided for measuring microprocessor susceptibility to internal noise A noise generator modulates a clock signal to generate noise on a targeted component within a microprocessor. A function generator executes microprocessor functions on a plurality of functional components within the microprocessor. A maximum execution frequency on the plurality of functional components is then measured and a set of frequency ranges where the functional components are susceptible to the generated noise is determined.

Measuring microprocessor susceptibility to internal noise generation

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Highland Mills, NY, United States of America

Ching Lung Tong