Chroma Ate Inc.

Chin-Yuan Chang

Chun-Hao Hu

Mao-Sheng Liu

Min-Hung Chang

Ching-Lin Lee

Tzu-Tu Chao

Shen-Hao Tsai

Ming-Hui Chen

Cheng-Hung Pan

Yu-Jui Liu

Hsueh-Cheng Hsieh

The present invention provides a surge protection module which comprises a carrier board and a probe set. The carrier board is used to carry an electronic component. The probe set is disposed on the carrier board and has a plurality of probes and a short-circuit unit. Each probe is used for contacting the electronic component, and the short-circuit unit is selectively moved to a first position or a second position. When the short-circuit unit is moved to the first position, the short-circuit unit simultaneously contacts and shorts the plurality of probes. When the short-circuit unit is moved to the second position, the short-circuit unit is away from at least one of the plurality of probes.

Surge protection module

The present invention provides a probe apparatus, which comprises a signal transmission device, a probe, and a bottom fixing device. The signal transmission device includes a first transmission part and a second transmission part. An end of the probe is connected electrically below the second transmission part. The bottom fixing device is disposed below the signal transmission device. An end of the bottom fixing device includes a first penetrating hole and a first recess is disposed below the end. The probe passes through the first penetrating hole of the bottom fixing device. The probe is located in the first recess. The bottom fixing device reinforces the mechanical strength of the signal transmission device so that the width of the signal transmission device can be reduced. Thereby, the benefit of high-density arrangement of the probe apparatus can be achieved.

Probe apparatus

Herein disclosed are a method and a test probe for testing an electrical component. The electrical component comprises at least a first electrode and a second electrode. The method comprises the following steps: covering the first electrode with a first conducting flexible layer; driving a first electrode contact to electrically connect a first end of the first electrode contact with the first electrode via the first conducting flexible layer; covering the second electrode with a second conducting flexible layer; and driving a second electrode contact to electrically connect a second end of the second electrode contact with the second electrode via the second conducting flexible layer. The first conducting flexible layer is an anisotropic conductive film.

Electrical component testing method and test probe

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Taoyuan, Taiwan

Chin-Yuan Chang