Samsung Electronics Co., Ltd.

Chin Won Cho

Jong Yun Yun

Jae June Kim

Yeong Kyun Lee

Hu Yul Bang

Gyu-Taek Kim

Chang Dong Yeo

Young Dug Jung

A method for optimizing UDMA transfer signals parameter that functions independently of a computer system is provided. The method of the invention utilizes UDMA CRC errors to adjust an optimized UDMA transfer signal parameter. A total error rate is logged for each selected parameter for determining the parameter with the lowest total error rate. The method functions continuously, to provide reduced CRC error generation and data corruption, and enhanced UDMA transfer signal integrity.

Method for optimizing UDMA transfer signals using CRC errors

The invention provides a method insuring that each read channel optimization step is controllable in terms of quality divergence, that a systematic response can be made which can be readily automated. The method is applicable to a pre-existing read channel optimization (RCO) script. The method includes the following operations. Acquiring a first quality measure and a first parameter list. Performing the pre-existing RCO script creating a second quality measure and a second parameter list based upon the first parameter list. Convergence processing the first and second quality measures and parameter lists.

Method and apparatus providing read channel optimization insurance to avoid divergence in channel optimization in an assembled disk drive

Methods and apparatus are disclosed determining the presence of base line popping noise for a read head inside an assembled disk drive, as well as, determining read bias conditions for operating the read head free of base line popping noise. These further include performance evaluation of the read head for read bias conditions free of base line popping noise. They also include repairing the read head using DC write current and read bias current within the assembled disk drive.

METHOD AND APPARATUS DETECTING BASE LINE POPPING NOISE IN A READ HEAD AND STABILIZING THE MAGNETIC DOMAIN OF MERGED MAGNETORESISTIVE READ-WRITE HEADS USING DC WRITE CURRENT AND READ BIAS CURRENT FOR AN ASSEMBLED DISK DRIVE

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San Jose, CA, United States of America

Chin Won Cho