Growing community of inventors

Clifton Park, NY, United States of America

Chin Teong Lim

Average Co-Inventor Count = 4.27

ph-index = 2

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 10

Chin Teong LimGuoxiang Ning (11 patents)Chin Teong LimPaul Willard Ackmann (10 patents)Chin Teong LimYuping Ren (3 patents)Chin Teong LimGuido Ueberreiter (3 patents)Chin Teong LimJui-Hsuan Feng (3 patents)Chin Teong LimHuang Liu (2 patents)Chin Teong LimXusheng Kevin Wu (2 patents)Chin Teong LimXintuo Dai (2 patents)Chin Teong LimChristopher A Spence (1 patent)Chin Teong LimXiang Hu (1 patent)Chin Teong LimGuo Xiang Ning (1 patent)Chin Teong LimDavid N Power (1 patent)Chin Teong LimLalit Shokeen (1 patent)Chin Teong LimChristian Buergel (1 patent)Chin Teong LimChin Teong Lim (12 patents)Guoxiang NingGuoxiang Ning (42 patents)Paul Willard AckmannPaul Willard Ackmann (28 patents)Yuping RenYuping Ren (13 patents)Guido UeberreiterGuido Ueberreiter (5 patents)Jui-Hsuan FengJui-Hsuan Feng (3 patents)Huang LiuHuang Liu (86 patents)Xusheng Kevin WuXusheng Kevin Wu (84 patents)Xintuo DaiXintuo Dai (21 patents)Christopher A SpenceChristopher A Spence (42 patents)Xiang HuXiang Hu (33 patents)Guo Xiang NingGuo Xiang Ning (4 patents)David N PowerDavid N Power (2 patents)Lalit ShokeenLalit Shokeen (1 patent)Christian BuergelChristian Buergel (1 patent)
..
Inventor’s number of patents
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Strength of working relationships

Company Filing History:

1. Globalfoundries Inc. (11 from 5,671 patents)

2. Globalfoundries Singapore Pte. Ltd. (1 from 1,016 patents)


12 patents:

1. 10002827 - Method for selective re-routing of selected areas in a target layer and in adjacent interconnecting layers of an IC device

2. 9817927 - Hard mask etch and dielectric etch aware overlap for via and metal layers

3. 9817940 - Method wherein test cells and dummy cells are included into a layout of an integrated circuit

4. 9672313 - Method for selective re-routing of selected areas in a target layer and in adjacent interconnecting layers of an IC device

5. 9672312 - Method wherein test cells and dummy cells are included into a layout of an integrated circuit

6. 9645486 - Multiple threshold convergent OPC model

7. 9606432 - Alternating space decomposition in circuit structure fabrication

8. 9535319 - Reticle, system comprising a plurality of reticles and method for the formation thereof

9. 9500945 - Pattern classification based proximity corrections for reticle fabrication

10. 9384318 - Mask error compensation by optical modeling calibration

11. 9329471 - Achieving a critical dimension target based on resist characteristics

12. 9250538 - Efficient optical proximity correction repair flow method and apparatus

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