Mediatek Corporation

Skymedi Corporation

Chin-Jung Su

Rei-Fu Huang

Chuang Cheng

A memory-testing device for testing a memory is provided. The memory-testing device includes a testing circuitry and a register. The testing circuitry is coupled to the memory for testing performance of the memory. The register is coupled to the testing circuitry and inputted by a testing clock signal, wherein the testing clock signal is different from an original clock signal of the memory and/or the testing circuitry. The testing clock signal is utilized for adjusting the time when the memory-testing device latches data from the memory to decrease a timing slack of the memory-testing device.

Memory-testing device and memory-testing method

A method and apparatus of generating the soft value for a memory device is disclosed. Memory read-related parameters are set, and data are read out of the memory device according to the set parameters. The data reading is performed for pre-determined plural iterations, thereby obtaining the soft value according to the read-out data and the set parameters.

Growing community of inventors

Hsinchu, Taiwan

Chin-Jung Su