Applied Materials, Inc.

Chikuang Charles Wang

Yuri S Uritsky

Thai Cheng Chua

Biao Liu

Srinivas Gandikota

Philip Allan Kraus

Xinliang Lu

Yu Lei

Chien-Teh Kao

Johanes F Swenberg

Bencherki Mebarki

Benjamin Schmiege

Shreyas Kher

Hanh D Nguyen

Xuesong Lu

Pingyan Lei

Rajkumar Jakkaraju

Benjamin C Wang

Christian Valencia

Yung-Hsin Lee

Ghazal Saheli

Giuseppina Conti

Juno Yu-Ting Huang

Shankar Muthukrisnan

Embodiments disclosed herein include methods and apparatuses used to deposit graphene layers. In an embodiment, a method of depositing a graphene layer on a substrate comprises providing a substrate within a modular microwave plasma chamber, and flowing a carbon source and a hydrogen source into the modular microwave plasma chamber. In an embodiment, the method further comprises striking a plasma in the modular microwave plasma chamber, where a substrate temperature is below approximately 400° C., and depositing the graphene layer on the substrate.

Method and apparatus of low temperature plasma enhanced chemical vapor deposition of graphene

Methods for depositing titanium oxide films by atomic layer deposition are disclosed. Titanium oxide films may include a titanium nitride cap, an oxygen rich titanium nitride cap or a mixed oxide nitride layer. Also described are methods for self-aligned double patterning including titanium oxide spacer films.

Deposition methods for uniform and conformal hybrid titanium oxide films

A method of operation of a measurement system includes: providing a specimen having a film; controlling a beam generator to direct a charged particle beam into the specimen; detecting a reference signal emitted from the specimen; normalizing the reference signal to create a film L-ratio; and determining a thickness of the film by correlating the film L-ratio to a calibration curve.

Measurement system with thickness calculation and method of operation thereof

A method, a system and a computer readable medium for dynamic mode AFM amplitude versus distance curve acquisition. In an embodiment, a constant force feedback mechanism is enabled prior to the first time an AFM probe tip contacts a sample. The feedback mechanism setpoint is iteratively reduced while at least phase and amplitude of the probe tip are recorded as a function of the relative z-height of a cantilever coupled to the probe tip. The feedback mechanism setpoint may be repeatedly swept between upper and lower bounds to average out drift between the cantilever and sample. Upon detecting a threshold, an absolute tip-to-sample distance is determined and correlated to the relative z-heights. The amplitude and phase data recorded prior to tip-sample contact is then determined as a function of absolute tip-to-sample distance.

Non-destructive ambient dynamic mode AFM amplitude versus distance curve acquisition

Methods for forming a integrated gate dielectric layer on a substrate are provided. In one embodiment, the method includes forming a silicon oxide layer on a substrate, plasma treating the silicon oxide layer, depositing a silicon nitride layer on the silicon oxide layer by an ALD process, and thermal annealing the substrate. In another embodiment, the method includes precleaning a substrate, forming a silicon oxide layer on the substrate, plasma treating the silicon oxide layer, depositing a silicon nitride layer on the silicon oxide layer by an ALD process, and thermal annealing the substrate, wherein the formed silicon oxide layer and the silicon nitride layer has a total thickness less than 30 &#x212b; utilized as a gate dielectric layer in a gate structure.

Method for fabricating an integrated gate dielectric layer for field effect transistors

Methods and apparatus for automatically determining a feedback setpoint for use in operating an atomic force microscope (AFM) are provided. The setpoint may be determined by modulating a feedback setpoint while monitoring for a change in a detector signal. In an effort to avoid tip damage and remain in non-contact, attractive mode during use, a setpoint just above a setpoint corresponding to a detected change in a parameter of the detector signal, such as an abrupt change in phase, may be used to operate the AFM.

Atomic force microscope technique for minimal tip damage

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San Jose, CA, United States of America

Chikuang Charles Wang