Riken Corporation

Topcon Corporation

S.i Seiko Co., Ltd.

Shibuya Seiki Co., Ltd.

Chiko Otani

Ken-ichiro Maki

Toshikazu Ebisuzaki

Kodo Kawase

Yoshiyuki Takizawa

Homare Momiyama

Hirohiko Shimizu

Masahiro Yamashita

Takayuki Shibuya

Isao Yoshimine

Tetsuya Yuasa

Kazunori Ninomiya

Yoshiaki Sasaki

Yoshiyuki Takahashi

Gosei Okazaki

Toru Kitaguchi

Atsushi Takasuka

Kengo Takahashi

Atsushsi Takasuka

Ken-Ichiro Maki

Provided is an optical interference measuring apparatus including a measuring unit for acquiring an interferogram of an interference wave obtained by irradiating a measuring target and a reference surface with electromagnetic waves and causing reflected waves from a reflecting surface of the measurement target and reflected waves from the reference surface to interfere and a signal processing unit for configuring an intensity profile in the depth direction by performing Fourier transform of the interferogram. The signal processing unit is configured to estimate a parameter for a model formula for an assumed surface count, based on the model formula of an interferogram when it is assumed that the measurement target has a predetermined structure, to select an optimal model by a statistical technique from the model formula to which a parameter estimated for the assumed surface count is applied, and to reconfigure an intensity profile based on the optimal model.

Optical interference measuring apparatus and optical interference measuring method

First and second laser beams are incident on a difference frequency mixing unit, and the two laser beams overlap in the difference frequency mixing unit, thereby generating a terahertz wave whose frequency is a frequency difference between the two laser beams. Each laser beam has a spatial spread in a frequency gradient direction, and a spatial frequency distribution of each laser beam is a distribution in which a magnitude of a frequency gradually increases in the frequency gradient direction. A frequency difference between the two laser beams is equal in each position in an overlapping region of the two laser beams. A terahertz wave of a single frequency is generated from this overlapping region. By spatially shifting the first laser beam and the second laser beam with respect to each other in the frequency gradient direction, the frequency difference in the overlapping region is changed, which changes the single frequency.

Terahertz wave generating method and apparatus

To provide a terahertz beam scanning apparatus and method that can scan a terahertz beam at high speed over a wide angle. The terahertz beam scanning apparatus includes: a laser devicethat generates a first laser beamand a second laser beamhaving different wavelengths; a laser optical systemthat focuses the first laser beamand the second laser beamon a same common focal point; and a terahertz generatorthat is located at the common focal point and generates a terahertz beamby difference frequency mixing. The laser optical systemis configured to be capable of changing a relative incidence &#x3b8;between the first laser beam and the second laser beam to the terahertz generator.

Terahertz beam scanning apparatus and method thereof

In an enclosure inspection apparatus, when a sealed letteris inputted into a sealed letter loading station A, visual inspecting meansand X-ray inspecting meansdetermine thickness of the sealed letter and whether an enclosure in the sealed letter is a predetermined suspected object. The sealed letter not less than a predetermined thickness is rejected in first sorting station D, and the sealed letter which is not thicker than the predetermined thickness and in which the suspected object is not detected is conveyed as it is to second sorting station G. As for the sealed letter which is not thicker than the predetermined thickness and in which the suspected object is detected, after the suspected object in the sealed letter is positioned in a positioning station E, a suspected object inspecting station F determines whether the above-described suspected object is a predetermined object, such as an explosive or a narcotic drug, using a terahertz wave. It is possible to detect promptly the presence of the objects even if there are a large number of sealed letters.

Enclosure inspection method and apparatus thereof

The light of a broad energy band can be observed by reflecting the light of the broad energy band, for example, the light from the visible light region to the x-ray region at a high reflectance respectively, by a composite telescope including a normal incidence optical system and an oblique incidence optical system. A broadband telescope comprise an oblique incidence optical system unit in which the light is obliquely incident on a surface part for reflecting the incident light, a normal incidence optical system unit in which the light is substantially vertically incident on a surface part for reflecting the incident light, and an analyzer for spectrum analysis of the light reflected by the surface part of the obliquely incidence optical system unit and the light reflected by the surface part of the normal incidence optical system unit.

Broadband telescope

Growing community of inventors

Wako, Japan

Chiko Otani