Nikon Corporation

Chikaya Iko

Tatsuro Otaki

Jun Matsuno

Hitoshi Sakano

Yasushi Ogihara

Kunio Toshimitsu

Katsumi Ogino

A microscope device includes a support member which supports a specimen, a first optical system which generates an image of a partial region upon the specimen, a second optical system which generates an overall image of the specimen, an imaging device which photoelectrically detects the images which are generated by the first optical system and by the second optical system, and a changeover mechanism which changes over between a first path from the specimen via the first optical system to the imaging device and a second optical path from the specimen via the second optical system to the imaging device. The support member, the first optical system, the second optical system, the imaging device, and the changeover mechanism are all housed within a case of the microscope device.

Microscope device and microscope system

A section image obtaining apparatus includes an image-capturing device that captures an image of a subject, a section specifying device that specifies the position of a section of the subject, an image of which is to be obtained, a distance adjusting device that adjusts the distance between the subject and the image-capturing device and an image processing device that rearranges the image obtained by the image-capturing device at the position specified by the section specifying device based upon the distance that has been adjusted by the distance adjusting device.

Section image obtaining apparatus and method of obtaining section image

A photographing unit for a microscope has a photometric detector to measure brightness of light from a sample and includes a changing member which changes a brightness of light toward an observation system and a control unit which controls the light based on a detection output of the photometric detector. In addition, the changing member can be controlled based on the presence of an observer. A shielding member can be provided that automatically shields an optical path of the observation system. An illumination system for an index on a reticle can be provided so that the illumination of the reticle can be performed or extinguished at desired times. Additionally, the color of light with which the index is illuminated may be made distinguishable from the color of light from a sample, and the contrast of the index to the sample can be controlled.

Photographing unit for a microscope

Microscope photographing unit with brightness control for observation

The present invention relates to a photographic apparatus comprising a photometric system which can tolerate a wide range of change in contrast. This photographic apparatus attains, at least, a state in which an image from an optical instrument such as microscope can be photographed and a state in which the light intensity of the image formed by the optical instrument can be measured by the photometric system utilizing a light separated from incident light. This photometric system comprises a plurality of optical systems respectively having magnifications different from each other and a photosensor having a light receiving surface defined by a plurality of light intensity detectors, wherein these plurality of optical systems and plurality of detectors are intentionally selected so as to change the range of measurement of an image formed on the light receiving surface of the photosensor.

Growing community of inventors

Yokohama, Japan

Chikaya Iko