Kabushiki Kaisha Toshiba

Toshiba Energy Systems & Solutions Corporation

Chikashi Miyamoto

Yasunori Taguchi

Yuichi Kato

Kouta Nakata

Toshio Aoki

Susumu Naito

Shinya Tominaga

Ryota Miyake

Naoyuki Takado

Isaku Nagura

Eiichi Ookuma

According to one embodiment, a monitoring apparatus includes a processing circuit. The processing circuit is configured to generate second data including a prediction value of a second sensor correlated with a first sensor from first data including a measurement value of the first sensor of which a measurement value changes suddenly in a case where the control signal changes, detect an anomaly of the system or an anomaly of at least one sensor, and make it difficult to detect the anomaly in a case where the determination signal indicates that there is a change in the control signal.

Monitoring apparatus, method, and program

According to an embodiment, a monitoring apparatus configured to generate time-series predicted data based on time-series measured data and a prediction model that generates predicted data including one or more predicted values predicted to be output from one or more sensors; and generate, for a first sensor among the one or more sensors, a displayed image including a measured value graph representing a temporal change in a measured value included in the time-series measured data in a second period after a first period, a predicted value graph representing a temporal change in a predicted value included in time-series predicted data in the second period, past distribution information representing a distribution of a measured value in the first period, and measurement distribution information representing a distribution of the measured value included in the time-series measured data in the second period.

Monitoring apparatus, monitoring method, computer program product, and model training apparatus

Growing community of inventors

Yokohama Kanagawa, Japan

Chikashi Miyamoto