Denso Corporation

Chikara Kobayashi

Hideaki Ishihara

Kenji Yamada

Yoshinori Teshima

Naoki Ito

Shinichirou Taguchi

Yoshinori Gotoh

Youichi Fujita

A microcomputer includes a main oscillator for generating and outputting a main clock signal, a sub oscillator for generating and outputting a sub clock signal, a central processing unit that operates based on the main clock signal, a signal output circuit that operates based on the sub clock signal and outputs a timing signal at a predetermined interval, and a voltage monitoring circuit that operates based on the sub clock signal and intermittently performs a voltage monitoring function in response to the timing signal. The sub oscillator operates independently of the main oscillator.

Microcomputer and control system having the same

A microcomputer having a sleep mode includes first and second chips received in a single package. The first and second chips are manufactured with different manufacturing processes such that a leak current in the first chip is less than that in the second chip. When a sleep signal for putting the microcomputer in the sleep mode becomes active, data stored in the second chip is transmitted to the first chip. After the data transmission is completed, a power supply voltage supplied to the second chip is stopped and the second chip stops its operation until the sleep mode is released. The data transmission is achieved by digital logic circuits that can be easily redesigned by using a conventional automatic layout generator.

Microcomputer

A semiconductor integrated circuit includes: a package; semiconductor chips in the package including a signal terminal; and a wiring connecting signal terminals. One semiconductor chip is a test object chip including a probe terminal and a test object terminal. The probe terminal connects to an external terminal for testing the test object terminal. The test object chip further includes: a common wiring for connecting the probe terminal and the test object terminal; a first switch for connecting/disconnecting the probe terminal and the common wiring; a second switch for connecting/disconnecting the test object terminal and the common wiring; and a test signal interrupting element for interrupting the test signal to be inputted into an input circuit of the probe terminal.

Semiconductor integrated circuit having multiple semiconductor chips with signal terminals

Growing community of inventors

Kodaira, Japan

Chikara Kobayashi