Sharp Kabushiki Kaisha Corporation

Chika Hirakawa

Tadashi Iwamatsu

Hiroshi Kawamura

Shohei Komaru

Fumiaki Sugimori

Mai Takasaki

Kinya Nobori

Hidemasa Kubota

An illumination system includes: an irradiation device that irradiates light to a subject located in front of a displayer that displays a background image; an information acquisition device that acquires subject information for identifying the subject; a storage that stores background image information on the background image displayed on the displayer; and a controller that controls irradiation by the irradiation device. The controller generates shape information of the subject on basis of a difference between the subject information acquired by the information acquisition device and the background image information stored in the storage, and sets an irradiation range where light is irradiated by the irradiation device on basis of the shape information.

Illumination system and photography system

An analyzer according to the present invention includes an electron emission element, a detector, an electric field generator, an electrostatic gate electrode, and a controller, in which the electron emission element includes a lower electrode, a surface electrode, and an intermediate layer, and directly or indirectly generates anions by electrons emitted in an ionization region between the electron emission element and the electrostatic gate electrode, the electrostatic gate electrode controls injection of the anions into a drift region between the electrostatic gate electrode and the detector, the detector detects the anions move through the drift region by a potential gradient, and the controller applies a pulse voltage between the lower electrode and the surface electrode, and applies a voltage to the electrostatic gate electrode such that the electrostatic gate electrode injects the anions into the drift region during a time when the pulse voltage is on.

Analyzer

An analysis apparatus includes an ionization section, an ion separation section, and an ion detection section. The ionization section generates one or more sample component-derived ions. The ion separation section separates the ions in accordance with mobility of the ions. The ion detection section detects the ion which passes through the ion separation section. The ionization section includes a reaction chamber and an electron emission element. A sample is introduced to the reaction chamber. The electron emission element emits an electron to the reaction chamber.

Analysis apparatus

Growing community of inventors

Sakai, Japan

Chika Hirakawa