Enlight Corporation

Hermes-epitek Corporation

Chih-Yao Chen

Chien-Yao Hung

A test probe card structure includes a probe card and a connection circuit common plate. The probe card includes a probe substrate, A test circuit board is disposed between the probe substrate and the connection circuit common plate, The test circuit board has a lest circuit connection section attached to and electrically connected with a common circuit adaptation section of the connection circuit common plate. A circuit extension section is formed around the connection circuit common plate, which is all-channel electrically connectable between a tester and the teat circuit connection section. The connection circuit common plate serves to provide an all-channel test circuit convergence connection ability for the test circuit board so as to greatly minify the size of the test circuit board and lower the manufacturing cost of the probe card.

Test probe card structure

A computer front cover mounting arrangement includes two doorposts fixedly fastened to two opposite vertical lateral sides of the face panel of a computer mainframe, each door post having two pivot shafts at top and bottom sides, and a front cover releasably coupled to the doorposts and covered on the face panel and selectively openable from the face panel from the left side or the right side, the front cover having backward coupling flanges in four corners, each coupling flange having a circular recess for coupling with one pivot shaft, and a guide groove for guiding the corresponding pivot shaft into coupling position.

Growing community of inventors

Hsinchu, Taiwan

Chih-Yao Chen