Taiwan Semiconductor Manufacturing Comp. Ltd.

Chih-Shiun Chou

Lin-Yu Huang

Chih-wei Chang

Chien Chang

Kan-Ju Lin

Harry Chien

Ming-Hsing Tsai

Sheng-Tsung Wang

Wei-Yip Loh

Hong-Mao Lee

Pinyen Lin

Yuting Cheng

Tzu-Pei Chen

Shao-An Wang

Tai Min Chang

TaiMin Chang

A method for manufacturing a semiconductor device includes forming a conductive feature in a first dielectric layer; forming a second dielectric layer on the first dielectric layer; forming a trench that penetrates through the second dielectric layer, and terminates at the conductive feature; forming a contact layer in the trench and on the conductive feature; etching back the contact layer to form a first via contact feature in the trench, the first via contact feature being electrically connected to the conductive feature; and forming a second via contact feature on the first via contact feature in the trench.

Semiconductor device including stacked via contact and method for manufacturing the same

A semiconductor structure and method of forming a semiconductor structure are provided. In some embodiments, the method includes forming a gate structure over a substrate. An epitaxial source/drain region is formed adjacent to the gate structure. A dielectric layer is formed over the epitaxial source/drain region. An opening is formed, the opening extending through the dielectric layer and exposing the epitaxial source/drain region. Sidewalls of the opening are defined by the dielectric layer and a bottom of the opening is defined by the epitaxial source/drain region. A silicide layer is formed on the epitaxial source/drain region. A metal capping layer including tungsten, molybdenum, or a combination thereof is selectively formed on the silicide layer by a first deposition process. The opening is filled with a first conductive material in a bottom-up manner from the metal capping layer by a second deposition process different from the first deposition process.

Semiconductor device structure and method for forming the same

A semiconductor device includes a gate structure on a semiconductor fin, a dielectric layer on the gate structure, and a gate contact extending through the dielectric layer to the gate structure. The gate contact includes a first conductive material on the gate structure, a top surface of the first conductive material extending between sidewalls of the dielectric layer, and a second conductive material on the top surface of the first conductive material.

Semiconductor structure and method of forming the same

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Hsinchu, Taiwan

Chih-Shiun Chou