Taiwan Semiconductor Manufacturing Comp. Ltd.

Chih-Sheng Shih

Edwin Liou

Andy Hong

Chiapin Wen

Winston Tsai

Jong-I Mou

Jo Fei Wang

Sunny Wu

Andy Tsen

Hsin Kuan

A production management system is configured to dynamically control inventory of a semiconductor product to prevent overstock and stockout. The production management system includes a production planning module including components containing data of demand forecast, and customer order. The production management system further includes a dynamic inventory control module including a dynamic inventory control simulation module and an inventory management system, wherein the inventory management system is configured to record real inventory data, and wherein the dynamic inventory control simulation module includes simulators for target inventory, future inventory, future shipment and semiconductor product production.

Methods and systems for dynamic inventory control

The embodiments of the present invention fill the need of properly controlling product inventory of semiconductor chips by providing methods and systems of dynamic inventory control. The methods and systems timely modify parameters affecting inventory. The parameters may include target inventory, cycle time, wafer start, future inventory and future shipment. In addition, the methods and systems gather real-time customer demand forecast to assist in production planning and adjustment. Further, the methods and systems identify inventory control turning points dynamically to adjust production activities to prevent overstock and to prevent stockout.

A method for providing bin-based control when manufacturing integrated circuit devices is disclosed. The method comprises performing a plurality of processes on a plurality of wafer lots; determining a required bin quantity, an actual bin quantity, and a projected bin quantity; comparing the determined required bin quantity with the determined actual bin quantity and determined projected bin quantity; and modifying at least one of the plurality of processes on the plurality of wafer lots if the determined actual bin quantity and determined projected bin quantity fail to satisfy the determined required bin quantity.

Method for bin-based control

Growing community of inventors

Jhubei, Taiwan

Chih-Sheng Shih