Chroma Ate Inc.

Gold Circuit Electronics Ltd.

Chih-Ming Tsai

Chao-Hsu Chen

Chung-Yu Siang

Tien-Chieh Kang

Han-Chou Liao

A measurement system is provided, including a measurement machine and a computer. The measurement machine is configured to measure a thickness Tof a to-be-tested circuit board and a drilling depth Dof the to-be-tested circuit board. The computer calculates a length Sof a residual conductive portion in a back drilled hole of the to-be-tested circuit board according to a thickness T of a reference circuit board, a drilling depth D of the reference circuit board, a length S of a residual conductive portion in a back drilled hole of the reference circuit board, the thickness Tof the to-be-tested circuit board and the drilling depth Dof the to-be-tested circuit board.

Measurement system

A method is provided for testing a semi-finished battery cell. The semi-finished battery cell is charged with a constant current when a voltage difference between the first conductor and the second conductor is less than a voltage threshold. The semi-finished battery cell is charged with a constant voltage when the voltage difference between the first conductor and the second conductor is equal to or larger than the voltage threshold. An overall electric quantity is obtained after a default time period, wherein the overall electric quantity is an electric quantity charged to the semi-finished battery cell with the constant current during the default time period. Accordingly, an insulation related to electrodes of the semi-finished battery cell is determined as poor when the overall electric quantity is larger than an electric quantity threshold.

Growing community of inventors

Taoyuan, Taiwan

Chih-Ming Tsai