Taiwan Mask Corporation

Chih-Kang Toh

Chih-Ming Chen

A test system, for testing a plurality of semiconductor devices, includes a carrying apparatus, an abutting apparatus and a pressing apparatus including a cover and a seat. The cover and the seat constitute a test chamber and a sealed auxiliary chamber. The carrying apparatus is disposed within the test chamber. Each semiconductor device is carried by one of a plurality of test sockets of the carrying apparatus. The abutting apparatus is disposed between the cover and the test sockets. The auxiliary chamber is extracted through at least one extraction hole, such that an air pressure in the auxiliary chamber is lowered to actuate the cover toward the seat and further to apply force to the abutting apparatus, and such that the abutting apparatus presses against the test sockets and the semiconductor devices to allow each test socket to electrically contact with the semiconductor device carried by said one test socket.

Test system for testing semiconductor devices

A heat exchanging apparatus includes a main body and N contact blocks formed on a head end surface of the main body, where N is a natural number. The main body therein has a multi-turn flow passage, a first arc-shell flow passage and a second arc-shell flow passage. Each contact block therein has a plurality of plate-shell flow passages parallel to each other and parallel to a longitudinal direction defined by the main body. The first arc-shell flow passage and the second arc-shell flow passage respectively communicate with the multi-turn flow passage and the plurality of plate-shell flow passages. A liquid flows into the multi-turn flow passage from an inlet of the multi-turn flow passage, and flows through the first arc-shell flow passage, the plurality of plate-shell flow passages and the second arc-shell flow passage, and flows out from an outlet of the multi-turn flow passage.

Growing community of inventors

Hsinchu County, Taiwan

Chih-Kang Toh