Novatek Microelectronics Corp.

Macronix International Co., Ltd.

Chih-Huang Lin

Hong-Chu Chen

Min-Hui Chu

Su-Wei Lien

Shiang-Fei Wang

Chin-Hui Huang

Chi-Fan Liou

Yi-Jen Wu

Jau-Hong Kao

Wei-Lung Liu

Tai-Yu Chiu

Chao-Chun Huang

Yeaun-Jyh Su

Chu-Shan Yu

Chen-Chung Yu

A control method for a first device of an inter-integrated circuit (IC) system including a microcontroller unit (MCU), includes receiving a first indication from the MCU of the IC system, wherein the first indication configures the first device from a slave mode to a master mode; polling the first device itself for status information of the first device when the first device is in the master mode; determining whether the status information of the first device matches a target status after polling; and determining to perform a parameter adjustment on a second device of the IC system when determining that the status information of the first device matches the target status.

[object Object]

A method for generating masking image using general polygonal mask includes receiving a pixel of a raw image and a polygon vertices array corresponding to a polygonal mask, determining whether the pixel is inside the polygonal mask, labeling the pixel to be a masked pixel if the pixel is inside the polygonal mask, or labeling the pixel to be a visible pixel if the pixel is outside the polygonal mask, and outputting the masked pixel or the visible pixel to generate the masking image.

Method for generating masking image using general polygonal mask

A semiconductor manufacturing execution system (MES) is disclosed, including a memory module, a comparing module, and an outputting module. The memory module stores a basic database and a recipe distribution management (RDM) database. The basic database includes multiple basic records, and the RDM database includes multiple RDM records. The comparing module compares operation data, received from a manufacturing machine, to each of the RDM records, and secondarily to each of the basic records, to determine whether the operation data matches at least one of the RDM and basic records. The outputting module outputs a limiting signal to the manufacturing machine if the operation data matches at least one of the RDM records. The limiting signal prevents the manufacturing machine from executing a process corresponding to the operation data. The outputting module may also output a first alarm signal to the manufacturing machine, and a second alarm signal to the user interface, if the operation data does not match at least one of the RDM and basic records. The semiconductor MES may also embody methods for adding new RDM records to the RDM database, editing RDM records in the RDM database, and/or deleting RDM records from the RDM database.

Semiconductor wafer manufacturing execution system with recipe distribution management database

Growing community of inventors

Hsinchu, Taiwan

Chih-Huang Lin