Pegatron Corporation

Chih-Ho Chen

Yu-Ting Chen

Wen-Pin Li

Guo-Yuan Tseng

A testing system is suitable for receiving at least one testing item of multiple device under tests (DUTs). The testing system comprises a plurality of testing devices and an arrangement unit. The arrangement unit is coupled to the testing devices. The arrangement unit generates at least one testing instruction according to the at least one testing item and detects an idle state corresponding to the at least one testing instruction, and transmits the at least one testing instruction to the testing device in the idle state, so as to trigger the testing device in the idle state to test the corresponding DUT according to the at least one testing instruction and generate a testing result.

Growing community of inventors

Taipei, Taiwan

Chih-Ho Chen