Altera Corporation

Chiew Khiang Kuit

Kar Keng Chua

Jayabrata Ghosh Dastidar

Jun Pin Tan

Yee Liang Tan

Tze Sin Tan

Siew Ling Yeoh

Chee Lam Ng

Nen Wei Ng

Kok Sun Chia

The present invention discloses a method of testing an analog-to-digital converter (ADC). The method includes receiving a series of analog signals from a tester site, converting the series of analog signals to a series of digital code words using an ADC, evaluating the ADC based on the series of digital code words using an ADC test setup and generating an output signal identifying whether the ADC has passed the testing.

Method and apparatus for using programmable logic circuitry to test on-chip analog-to-digital converter

Integrated circuits (ICs) with configurable test pins and a method of testing an IC are disclosed. An IC has input/output (I/O) pins that can be configured either as a test input pin, a test output pin or a user I/O pin. Selector circuits are used to selectively route and couple the I/O pins to various logic blocks and test circuitry on the IC. Selector circuits are also used to selectively couple either a user output or a test output to different I/O pins on the IC. Switches are used to configure the selector circuits and route test signals within the IC. Different configurations of the switches determine how the signals are routed. Test input signals from an I/O pin may be routed to any test circuitry within the IC and test output signals from a test circuit may be routed to any I/O pin on the IC.

Integrated circuit with configurable test pins

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Bukit Mertajam, Malaysia

Chiew Khiang Kuit