Intel Corporation

Altera Corporation

Chieu Fung Tan

Tat Hin Tan

Kian Boon How

William Walter Fergusson

My Chien Yee

A methodology for defining resistance-capacitance (RC) design targets based on radio-frequency (RF) simulation is provided. In particular, the method may involve first determining capacitance targets and then determining resistance targets. To compute the capacitance targets, integrate circuit design and simulations tools may run transient analysis to identify critical nodes, perform small signal and sensitivity analysis for the capacitance on the critical nodes, revise original RF specifications by allocating additional margin, and perform interpolation among multiple capacitance values to obtain capacitive design targets that meet the revised specifications. To compute the resistance targets, the circuit design tools may identify critical transistors, run single-pass and DC operating point simulation to determine initial resistance values for the critical transistors, simplify parallel resistive networks, perform sensitivity analysis on the simplified networks, and perform interpolation among multiple resistive values to obtain resistive design targets meet the original RF performance specifications.

Methods for determining resistive-capacitive component design targets for radio-frequency circuitry

Systems and methods for extracting one or more electrical specifications from a prelayout simulation of an integrated circuit design, where the one or more electrical specification are utilized to generate a physical layout of one or more components of an integrated circuit.

Growing community of inventors

Bukit Mertajam, Malaysia

Chieu Fung Tan