Acer Inc.

C.c.p. Contact Probes Co., Ltd.

Chien-Yu Hsieh

Hsing-Yi Kao

Ju-Hsien Weng

Tzu-Hsiang Chang

Wei-Yi Li

Te-Ho Chen

Hsueh-Chih Peng

Chun-Chieh Chiu

Bor-Chen Tsai

Cheng-Yu Cheng

Yen-Chun Chen

Wei-Chu Chen

Yen-Wei Lin

Yi-Ming Chang

Yu-Min Cheng

Lun-Yu Hung

Yen-Hui Lu

You-Yu Lo

Ting-Chen Pan

Chih-Hui Hou

An insulator applied in a probe base including a probe mounting hole, the insulator is a sheet structure having plural through holes, and the probe mounting hole is formed at the center of the insulator, and the probe mounting hole and the through hole penetrate from a first surface to a second surface of the insulator, and the regions of the first and second surfaces without the probe mounting hole and the through hole are coplanar. The probe base has a base body and at least a composite assembly, and the base body has at least a testing zone, and the composite assembly is installed in the testing zone and has at least a probe hole for installing a probe, and the insulator is installed into the probe hole.

Insulator applied in a probe base and the probe base

Portion of keyboard for computers

Notebook computer

A probe structure includes a sleeve, a needle shaft and an elastic member. The needle shaft is accommodated in the sleeve and includes a first groove for accommodating the elastic member. The probe structure further includes a conductive component installed at the bottom of the sleeve and having an end connected into the first groove, and a second groove, so that the elastic member is situated in the first and second grooves. When the needle shaft is pressed and moved, the inner wall of the second groove is contacted with an outer sidewall of the conductive component to define a second conductive channel. With the two conductive channels, the effects of maintaining stable current transmission efficiency, reducing poor contact or disconnection, and providing good structural stability are achieved.

Probe structure

Growing community of inventors

Taipei, Taiwan

Chien-Yu Hsieh