Industrial Technology Research Institute

Chien-Liang Lai

Lun-Chia Kuo

Hung-Yuan Chen

Sen-Chia Chang

Te-Ming Chen

Chi-Ting Day

A method for monitoring a manufacturing apparatus includes collecting a control signal, of a controller and a corresponding sensing signal, of the manufacturing apparatus over a predetermined period of time; segmenting the control signal and the corresponding sensing signal to obtain at least one control step; calculating a character of the controller based on at least one of the control signal, the sensing signal, the at least one control step, or information from a user manual; generating, based on the character, a health index indicating health of the controller; and generating a warning signal when the health index exceeds a predetermined threshold.

Method, apparatus, and system for monitoring manufacturing equipment

A method for identifying an electric appliance and an apparatus and a system thereof are provided. The method includes the following steps: respectively collecting a first power event on a first phase power and a second power event on a second phase power; when the first power event and/or the second power event are collected, determining whether the first power event and the second power event substantially occur at the same time; if not, identifying an unknown electric appliance as a first type electric appliance; and if yes, determining whether the first power event and the second power event are substantially the same, wherein if yes, identifying the unknown electric appliance as a second type electric appliance, and if no, identifying the unknown electric appliance as the first type electric appliance.

Method for identifying electric appliance and apparatus and system thereof

A method for identifying an electronic apparatus is provided. The method is adapted for a monitor apparatus in a power system, and includes the following steps of adaptively updating a power signature database related to at least one electronic apparatus; adaptively updating a line resistance database related to the monitor apparatus; detecting whether at least one power signature event occurs; calculating a system impedance of the at least one power signature event when the at least one power signature event occurs; and identifying at least one unknown electronic apparatus resulting the at least one power signature event according to the system impedance, the power signature database and the line resistance database.

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Hsinchu County, Taiwan

Chien-Liang Lai