Hon Hai Precision Industry Co., Ltd.

Compal Electronics, Inc.

Chien-Hao Huang

Ga-Lane Chen

Shao-Kai Pei

Chung-Pei Wang

Chia-Ying Wu

Chao-Tsang Wei

Wei-Cheng Ling

Chung-Ho Chen

Gin-Yuan Sheh

A article includes a substrate and a metal dielectric reflective film. The metal dielectric reflective film is formed on the substrate, the metal dielectric reflective film includes a dielectric multiple layer and a metal layer. The dielectric multiple layer includes a first layer, a second layer, a third layer, and a fourth layer arranged in the order written and stacked one on another. The first and third layers comprised of a low refractive index material, the second and fourth layers comprised of a high refractive index material. The metal layer is disposed on the fourth layer.

Article having metal dielectric reflective film

An exemplary wet coating system includes a coating chamber, an annealing chamber, an unloading chamber, and a mechanical arm. The coating chamber is configured for allowing a substrate being wet coated therein. The unloading chamber is configured for allowing the substrate being unloaded therein. The annealing chamber is interposed between and communicated with the coating chamber and the unloading chamber and is configured for allowing the substrate being annealed therein. The communicated coating chamber, annealing chamber, and unloading chamber are vacuumized. The mechanical arm is configured for holding the substrate and moving the substrate across the coating chamber, the annealing chamber, and the unloading chamber.

Wet coating system having annealing chamber

A multilayer substrate includes a base layer, a coating layer and an intermediate layer positioned between the base layer and the coating layer. The intermediate layer contains chromium and nitrogen. A content of the chromium in the intermediate layer gradually decreases from the base layer to the coating layer.

Multilayer substrate

A photocatalysis testing device includes a reaction chamber, a light source, and a spectrophotometer. Reactants including a methylene blue (MB) solution and a photocatalyst can be added to the reaction chamber and illuminated by the light source. Color vanishing rate of the MB solution can be measured by the spectrophotometer. Further, the photocatalysis testing device also includes a light-tight chamber and a temperature stabilizer. The reaction chamber and the light source are received in the light-tight chamber to avoid ambient light effecting on the photocatalysis test. The spectrophotometer is positioned outside the light-tight chamber and optically coupled to the reaction chamber. The temperature stabilizer is configured for stabilizing temperature of the MB solution.

Photocatalysis testing device

An input protection circuit is provided for protecting internal circuitry of a handheld electric device. The internal circuitry has a positive input node and a ground node. The input protection circuit includes a power socket having a positive input node and a ground node, a bipolar junction transistor (BJT), a metal-oxide semiconductor (MOS) transistor for controlling the on and off states of the BJT, and an overvoltage protective circuit. An emitter of the BJT is electrically connected to the positive input node of the power socket, and a collector is electrically connected to the positive input node of the internal circuitry. When a reverse DC voltage or a DC voltage exceeding a threshold inputs from the power socket, the overvoltage protective circuit will turn off the MOS transistor, thereby turning off the BJT to prevent damages of the internal circuitry.

Growing community of inventors

Taipei Hsien, Taiwan

Chien-Hao Huang