Taiwan Semiconductor Manufacturing Comp. Ltd.

Chien-Fei Cheng

Chien-Wei Wang

Shi-Ming Wang

Ming Fang Wang

Li-Ren Lin

Chih-Chien Chang

Larry Jann

Chang-Hsi Lin

Kun-Chi Liu

Birgie Kuo

Shiaw-Lin Chi

Liang Po Hsiung

Yi-Fang Su

Bruce Chen

Yuan-Ching Lu

Pei-Chen Yeh

Lieh-Jung Chen

I Chun Chen

Fang-Ni Wu

A semiconductor manufacturing system includes a centralized computer integrated manufacturing (CIM) system; a plurality of sectional CIM systems respectively associated with a plurality of manufacturing facilities and coupled with the centralized CIM system; and a centralized basic record module, coupled and coordinated with the centralized CIM system, and designed for defining a unified process flow associated to a mobile object.

Independent, self-contained, risk isolated, sectional CIM design for extremely large scale factory operation

A method for prevention of system execution malfunction is provided. First, an IDL (Interface Definition Language) file is compiled using an IDL compiler to generate a compiled IDL file. The compiled IDL file is converted by defining additional operations corresponding to a specific operator in the compiled IDL file. When a program comprising the converted file is executed with the specific operator, the additional operations are performed before original operations thereof.

Method for prevention of system execution malfunction

A semiconductor fabrication enterprise includes fabrication equipment, transportable containers for work&#x2014;in&#x2014;process and an enterprise information system. The transportable containers have associated radio frequency tags having identification codes uniquely identifying the carriers in the fabrication process. The enterprise information system contains data corresponding to each such identification code. The identification codes are read by a radio frequency interrogation device, and the radio frequency interrogation device carries out transactions with the enterprise data system to transfer the data corresponding to the identification codes to the radio frequency interrogation device. The radio frequency tags may be adapted for read/write functionality allowing for writing data to the radio frequency tags and synchronization of radio frequency tag data and enterprise information system data.

Wireless wafer carrier identification and enterprise data synchronization

A manufacturing management system and method. The system includes a manufacturing execution system and a plurality of manufacturing sites coupled to the manufacturing execution system. The manufacturing execution system comprises management data to support the manufacturing sites. Each manufacturing site comprises a corresponding site attribute. At least one of the manufacturing sites receives a lot, queries the management data for the lot from the manufacturing execution system according to lot identification and the site attribute of the manufacturing site receiving the lot, and processes the lot accordingly.

Manufacturing management system and method

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Hsin Tien, Taiwan

Chien-Fei Cheng