Advanced Ion Beam Technology, Inc.

Sunplus Mmobile Inc.

Chien-Cheng Kuo

Chunli Wu

Tsung-Liang Lu

Yu-Ho Ni

Te-Min Wang

Chien-Li Chen

Yen-Chen Chen

Chih-Wen Chang

A method for calibrating element in a semiconductor processing device with a camera is provided. The method for calibrating element in a semiconductor processing device with a camera includes taking a first picture of a first element by a camera; providing a first actuator to move the first element an increment along a first direction; taking a second picture of the first element by the camera; and comparing the first picture and the second picture to calibrate the first element. A system for calibrating element in a semiconductor processing device with a camera is also provided.

Calibration system with at least one camera and method thereof

A method for avoiding unnecessary excessive stay of short cycle in discontinuous reception mechanism begins by using the short cycle while the short cycle timer is running. Then, it determines whether the inactivity timer expires or not and whether the short cycle timer expires or not. If the inactivity timer expires but the short cycle timer does not expire, the short cycle is used. If the short cycle timer expires but the inactivity timer does not expire, the long cycle is used. If the inactivity timer and the short cycle timer expire at the same time, either the short cycle or the long cycle is selected for use.

Method for avoiding unnecessary excessive stay of short cycle in discontinuous reception mechanism

Growing community of inventors

Tainan, Taiwan

Chien-Cheng Kuo