Realtek Semiconductor Inc.

Chieh-Chih Che

Chun-Yi Kuo

Pei-Ying Hsueh

Chien-Mo Li

A multiple defect diagnosis method includes: receiving a gate-level netlist of a chip, a plurality of test patterns and a plurality of test failure reports; deriving a plurality of seed nets from the gate-level netlist according to the plurality of test patterns and the plurality of test failure reports; utilizing a processor to compute similarity between the plurality of seed nets, and accordingly merging the plurality of seed nets to obtain a single seed net tree; and deriving at least one suspected seed net according to the single seed net tree.

Growing community of inventors

Taoyuan County, Taiwan

Chieh-Chih Che