Hannstar Display Corporation

Green Energy Nano Technology Co., Ltd.

Chia-Yu Wang

Jia-Shyong Cheng

Juin-Hong Cherng

En Meng

Tien-Show Liang

Shing-shiang Chang

Shu Han Liang

Shu Ting Liang

Wen Sheng Lee

Sheng-Tang Wu

Shu-Jen Chang

Shen-Tang Wu

A quilt structure with non-powered energy layer having an insulating layer, a first barrier layer, a second barrier layer, a first fabric layer and a second fabric layer is provided. The first barrier layer and the second barrier layer are disposed on two opposite sides of the insulating layer. The first fabric layer is disposed on one of the first barrier layer or the second barrier layer opposite the insulating layer, and the second fabric layer is disposed on another of the first barrier layer or the second barrier layer opposite the insulating layer. At least one of the insulating layer, the first fabric layer and the second fabric layer has bio-energetic fibers or far-infrared fibers.

Quilt structure with non-powered energy layer and far-infrared fibers to make the same

An LCD panel testing method. The method comprises forming jump lines in a predetermined region on the substrate between the signal lines via mask design when forming TFT LCD arrays, and thus forming a plurality of signal-line groups each with two signal lines coupled by the jump lines. Thereupon, an array tester sequentially tests two pixels corresponding to the signal lines in the signal groups. If one of the feedback signals from the signal groups does not meet a predetermined standard, it is determined that one or both pixels in the signal group are defective. The defective pixel or pixels are then identified using an electronic microscope to test two pixels at the same time. In this way, the number of probe pins and tests performed is halved. The probe pin size is also thus less restrictive due to larger probe pin intervals. Consequently, yield is greatly increased.

LCD testing method

Growing community of inventors

Taipei, Taiwan

Chia-Yu Wang