Taiwan Semiconductor Manufacturing Comp. Ltd.

Chia-Yu Wang

Tien-Wei Chiang

Chun-Jung Lin

Kuei-Hung Shen

Meng-Chun Shih

Ching-Huang Wang

The disclosure is related a method for testing a magnetic memory device and a test apparatus are provided. In some exemplary embodiments, the method includes at least the following steps. The magnetic memory device is initialized by applying a first magnetic field to force write a first data to the magnetic memory device. Then, a second magnetic field is applied to the magnetic memory device. Second data may be obtained from the magnetic memory device by performing a chip probing process. Accordingly, performance of the magnetic memory device may be determined based on the second data.

Growing community of inventors

Hsinchu County, Taiwan

Chia-Yu Wang