Industrial Technology Research Institute

Chia-Liang Yeh

Hsin-Yi Chen

Sen-Yih Chou

Hsin-Cheng Lin

Yi-Chang Chen

Yan-Rung Lin

Yi-Sha Ku

Yi-Chen Hsieh

Chung-Lun Kuo

Chun-Wei Lo

Mao-Sheng Huang

Fu-Cheng Yang

Yu-Ying Lan

Hsiao-Wei Liu

Wei-Hsiung Tsai

Yeou-Sung Lin

Keng-Li Lin

An object identification method includes: establishing a training data base including a photographing distance of a training image and a training camera parameter; in photographing a target test object, obtaining a test image, a depth image, an RGB image and a test camera parameter; and based on the training database, the depth image and the test camera parameter, adjusting the RGB image wherein the adjusted RGB image having a size equivalent to the training image of the training database.

Object identification method and device

An image recognition method adapted to recognize a target image is provided. The method includes: providing the target image; training a learning database based on a plurality of feature blocks of the target image; randomly obtaining a plurality of incomplete feature blocks of the target image; adding the plurality of incomplete feature blocks into the learning database to form an enhancement learning database; and recognizing the target image based on the enhancement learning database. In addition, an image recognition device is also provided.

Image recognition method and device thereof

An eye tracking apparatus and an eye tracking method for the eye tracking apparatus are provided. The eye tracking apparatus includes an image capture device and a computing device. The image capture device is adapted to capture at least one face image. The computing device is coupled to the image capture device. The computing device receives the face image to obtain an eye image and identifies at least one iris region of the eye image. The computing device chooses the largest iris region from the iris regions to obtain a fitting pattern of the largest iris region and obtains a gaze point of the eye image based on the fitting pattern.

Eye tracking apparatus and method thereof

A scattering measurement system is provided, including: a light source generator for generating a detection light beam with discontinuous multi-wavelengths, and generating a multi-order diffraction light beam with three-dimensional feature information when the detection light beam is incident on an object; a detector having a photosensitive array for receiving and converting the multi-order diffraction light beam into multi-order diffraction signals with the three-dimensional feature information; and a processing module for receiving the multi-order diffraction signals and comparing the multi-order diffraction signals with multi-order diffraction feature patterns in a database so as to analyze the three-dimensional feature information of the object.

Scattering measurement system and method

A multi-point spectral system includes an imaging lens, an image capturing module and a multiwavelength filter (MWF) disposed between the imaging lens and the image capturing module. The MWF has a plurality of narrow-bandpass filter (NBPF) units arranged in an array, and each of the plurality of NBPF units has a respective predetermined central transmitted wavelength. The multi-point spectral system is provided to capture plural spectral images of a scene, which contain spectral or color information of the scene. The multi-point spectral system may utilize the information of the plural spectral images to recognize features revealed at the scene.

Multi-point spectral system and multi-point spectral module to be mounted on, clipped on or connected to an image capturing module of an electronic device easily

A device and method for detecting crystal quality of a low temperature poly-silicon (LTPS) backplane are provided, the method including: projecting narrowband light to the LTPS backplane; performing image capturing of each position on a surface of the LTPS backplane at a first angle in a first axial direction to obtain a first diffraction image, the first angle being an angle of maximum diffraction light intensity in the first axial direction; performing another image capturing of each position on the surface of the LTPS backplane at a second angle in a second axial direction to obtain a second diffraction image, the second angle being an angle of maximum diffraction light intensity in the second axial direction; and determining the crystal quality of the LTPS backplane based on a diffraction light intensity distribution obtained from the first and second diffraction images.

Quality detecting device and method

Growing community of inventors

Miaoli County, Taiwan

Chia-Liang Yeh