National Formosa University

Chia-Hung Wu

Wen-Yuh Jywe

Chien-Hung Liu

Tung-Hui Hsu

Teng-Yu Yang

Yun-Feng Teng

Jing-Chung Shen

Chin-Tien Yang

Jau-Jiu Ju

Chun-Chieh Huang

Lili Duan

Yuan-Chin Lee

I-Ching Chen

Ren-Chieh Fung

A manufacturing-process equipment has a platform assembly, a measurement feedback assembly and a laser-working assembly. The platform assembly has a base and a hybrid-moving platform. The base has a mounting frame. The hybrid-moving platform is mounted on the base and has a long-stroke moving stage and a piezo-driven micro-stage. The long-stroke moving stage has a benchmark set and a driving device. The piezo-driven micro-stage is connected to the long-stroke moving stage and has a working platform. The measurement feedback assembly is securely mounted on the platform assembly and has a laser interferometer, a reflecting device and a signal-receiving device. The laser-working assembly is mounted on the platform assembly, is electrically connected to the measurement feedback assembly and has a laser direct-writing head, a controlling interface device and a positioning interface device.

Manufacturing-process equipment

An optical calibration and testing device for machine tools includes a light source unit, a beam splitter, and at least one photo detector. The light source emits a laser light hitting the beam splitter and is split into two beams. One is perpendicular to the foundation of the light source unit, and the other is parallel with the foundation so as to test straightness, inclination angle, verticalness, vertical column inclination, vertical column parallelism and guide bar inclination of a machine tool. If there is no tested error, the position of the testing light spot coincides with that of the initial light spot. If there is an error, the position of testing light spot varies according to the error.

Optical calibration and testing device for machine tools

A high precision, rapidly operable optical parallelism measurement device includes a light source module, a light beam splitting module and at least two photoelectric detectors. The light source module has a light source and a light beam splitting element such that the light source module is able to produce two light beams perpendicular to each other. One of them is parallel to the moving direction, and is received by one of the detectors, while the other beam is split into two beams perpendicular to each other by the light beam splitting module. One beam is parallel to the former parallel by moving beam and is received by the other detector. With this scheme, the measurement can be performed by means of those perpendicular and parallel light beams without being affected by the structure of the machine platen to cause errors. The device can be manufactured with low cost and high precision. It is very compact in size and easy to carry and build up for rapid measurement.

Optical parallelism measurement device

Growing community of inventors

Taixi, Taiwan

Chia-Hung Wu