Texas Instruments Corporation

Chi-Tsung Lee

Byron Harry Gibbs

Andrew Patrick Couch

Ching-Han Chang

David Anthony Graham

Chien-Lin Wu

Chun-Hsien Lu

Ming-Chuan You

Stanley Hsu

An embodiment includes a first lead guide, a second lead guide, and a handler. The first lead guide includes a first insulating housing and a first conductive contact having a face and a recessed face. The second lead guide includes a second insulating housing and a second conductive contact. The first and second lead guides are fastened to the handler.

Lead guides having a recessed face

A handler for holding an electronic device during high voltage testing includes conductive lead guides for shorting leads on one side of the isolator together and connectors connecting the lead guides to conductors.

High-voltage isolator testing

A contactor assembly for automated testing a device under test (DUT) that includes a plurality of separate electrodes including a first electrode includes a tester load board and a contactor body coupled to the tester load board. A plurality of contactor pins carried by the contactor body includes a first contactor pin and a second contactor pin that are electrically coupled to the tester load board. The tester load board is configured to couple the plurality of contactor pins to automatic test equipment (ATE) for testing the DUT. The first contactor pin and second contactor pin are positioned to both contact the first electrode. A first path to the first contactor pin and a second path to the second contactor pin are electrically shorted together by the contactor assembly to be electrically in parallel to provide redundant paths to the first electrode during automated testing of the DUT.

Contactor with multi-pin device contacts

Growing community of inventors

Taipei, Taiwan

Chi-Tsung Lee