Samsung Electronics Co., Ltd.

Chi-Sung Oh

Ho-Cheol Lee

Dong-Hyuk Lee

Jin-Kuk Kim

Yong-Jun Kim

Kyung-Woo Nam

Jung-bae Lee

Soo-Young Kim

Jung-Sik Kim

Hyung-Dong Kim

Jung-Bae Lee

Jin-ho Kim

Uk-Song Kang

Nam-Jong Kim

Hoon Bok Lee

Jang-Woo Ryu

Jong-Wook Park

Hyo-Joo Ahn

Sang-kyu Kang

A semiconductor memory device includes a semiconductor die and an input-output bump pad part. The semiconductor die includes a plurality of memory cell arrays. The input-output bump pad part is formed in a central region of the semiconductor die. The input-output bump pad part provides a plurality of channels for connecting each of the memory cell arrays independently to an external device. The semiconductor memory device may adopt the multi-channel interface, thereby having high performance with relatively low power consumption.

Semiconductor memory devices and semiconductor packages

A stacked semiconductor memory device is provided which includes a first memory chip including a first transmission line, a second transmission line, and a logic circuit configured to execute a logic operation on a first signal of the first transmission line and a second signal of the second transmission line. The stacked semiconductor memory device further includes a second memory chip stacked over the first memory chip, an inter-chip connection unit electrically coupled between the second memory chip and the first transmission line of the first memory chip, and a dummy inter-chip connection unit electrically coupled to the second transmission line of the first memory chip and electrically isolated from the second memory chip.

Stacked memory device having inter-chip connection unit, memory system including the same, and method of compensating for delay time of transmission line

Semiconductor devices configured to test connectivity of micro bumps including one or more micro bumps and a boundary scan test block for testing connectivity of the micro bumps by scanning data input to the micro bumps and outputting the scanned data. The semiconductor device may include a first chip including solder balls and at least one or more switches electrically coupled with the respective solder balls, and a second chip stacked on top of the first chip and electrically coupled with the switches in direct access mode, including micro bumps that input/output signals transmitted from/to the solder balls.

Semiconductor devices and semiconductor packages

A method of arranging pads in a semiconductor memory device, the semiconductor memory device using the method, and a processing system having mounted therein the semiconductor memory device. The method includes classifying pads provided in a memory chip of the semiconductor memory device into monitoring pads configured for a memory chip test on a wafer, a package pads configured for wire connection in a package, and common pads configured for both the memory chip test on the wafer and wire connection in the package and arranging the monitoring pads and the package pads separately in columns on the memory chip.

Method of arranging pads in semiconductor device, semiconductor memory device using the method, and processing system having mounted therein the semiconductor memory device

A semiconductor device is provided. The semiconductor device applies data applied through a bump pad on which a bump is mounted through a test pad to a test apparatus such that the reliability of the test can be improved. The amount of test pads is significantly reduced by allowing data output through bump pads to be selectively applied to a test pad. Data and signals applied from test pads are synchronized with each other and applied to bump pads during a test operation such that the reliability of the test can be improved without the need of an additional test chip.

Semiconductor device

Provided is a synchronous dynamic random access memory (DRAM) semiconductor device including multiple output buffers, a strobe control unit and multiple strobe buffers. Each of the output buffers is configured to output one bit of data. The strobe control unit is configured to output multiple strobe control signals in response to an externally input signal. The strobe buffers are connected to the output buffers and the strobe control unit, and each of the strobe buffers is configured to output at least one strobe signal. At least some of the strobe buffers are activated in response to the strobe control signals, and the output buffers are activated in response to the strobe signals output by the activated strobe buffers.

Synchronous dynamic random access memory semiconductor device for controlling output data

A multi-port memory device includes first and second ports, a first dedicated memory area assigned to the first port, a plurality of shared memory units having shared access by the first and second ports, a first set of I/O lines for the first dedicated memory area, and a second set of I/O lines for the shared memory units with the second set having more I/O lines than the first set. For example, the second set has N times more I/O lines than the first set, with N being a number of ports of the multi-port memory device or with N being a number of shared memory banks in a shared memory area.

Routing access with minimized bus area in multi-port memory device

A multi-port memory device includes a refresh register and a refresh controller for preventing refresh starvation in a shared memory unit of the memory device. The memory device further includes a plurality of ports sharing access to the shared memory unit. The refresh register stores information regarding at least one refresh command. The refresh controller determines whether to activate an internal refresh operation at a transition in port authority according to such information stored in the refresh register.

Method, device, and system for preventing refresh starvation in shared memory bank

A semiconductor memory device includes a sense amplifier, a sense amplifier driving signal driver, and a controller. The sense amplifier is configured to sense and amplify a signal of a bit line and a signal of a complementary bit line in response to a sense amplifier driving signal. The sense amplifier driving signal driver includes a first driving signal driver configured to drive via a transmission line the sense amplifier driving signal in response to a first sense amplifier control signal, and a second driving signal driver configured to drive via the transmission line the sense amplifier driving signal in response to a second sense amplifier control signal. The controller activates the first sense amplifier control signal in response to an active command, and toggles the second sense amplifier control signal while the first sense amplifier control signal is activated.

Semiconductor memory device in which a method of controlling a BIT line sense amplifier is improved

A multipath accessible semiconductor memory device having a mailbox area and a mailbox access control method thereof are provided. The semiconductor memory device includes N number of ports, at least one shared memory area allocated in a memory cell array, and N number of mailbox areas for message communication. The at least one shared memory area is operationally connected to the N number of ports, and is accessible through a plurality of data input/output lines to form a data access path between the at least one shared memory area and one port, having an access right to the at least one memory area, among the N number of ports. The N number of mailbox areas are provided in one-to-one correspondence with the N number of ports and are accessible through the plurality of data input/output lines when an address of a predetermined area of the at least one shared memory area is applied to the semiconductor memory device. An efficient layout of mailboxes and an efficient message access path can be obtained.

Multi-path accessible semiconductor memory device having mailbox areas and mailbox access control method thereof

A semiconductor memory device includes a memory cell array having at least one memory bank. The memory bank being divided into memory blocks such that the memory blocks have a block position including at least one edge memory block at an edge of the memory bank and at least one non-edge memory block. Each memory block includes a plurality of memory cells. Each memory cell associated with at least one bit line and at least one word line. The semiconductor memory device includes a refresh execution circuit configured to activate a less than or equal number of word lines one at a time during a refresh operation for the memory cells in the edge memory block as activated one at a time during a refresh operation for the memory cells in the non-edge memory block.

Semiconductor memory device having refresh circuit and word line activating method therefor

A multi-path accessible semiconductor memory device having a shared memory area in a DRAM memory cell array that can be randomly accessed by a plurality of processors is provided. The multi-path accessible semiconductor memory device includes at least one shared memory area allocated in a memory cell array, operably connected to ports corresponding to a plurality of processors, each port used by the corresponding processor to selective access the shared memory area. The device further comprises an occupancy state signaling unit to output port occupancy state information to the processor requesting access to the shared memory area through the port used for the access request to indicate whether access to the shared memory area is allowed.

Multi-path accessible semiconductor memory device having port state signaling function

A semiconductor memory device and a method therefor for changing an access right to access a shared memory area according to an external command and a refresh mode is provided. In one embodiment, the semiconductor memory device includes a plurality of input/output ports for inputting command signals for first or second mode refresh operation, a memory array divided into a plurality of different memory areas including a shared memory area that is accessible via at least two of the plurality of input/output ports, and a grant control block for assigning an access right to access the shared memory area in response to an external command signal. The grant control block may also generate grant control signals for preferentially assigning the access right to access the shared memory area to the input/output port for inputting the command signals for the first mode refresh operation.

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Gunpo-si, South Korea

Chi-Sung Oh