Winbond Electronics Corporation

Windbond Electronics Corp.

Chi-Shun Lin

Chuen-Der Lien

Ming-Huei Shieh

Ngatik Cheung

Seow Fong Lim

Douk-Hyoun Ryu

Seow-Fong Lim

Johnny Chan

Lih-Wei Lin

Tsung-Huan Tsai

Frederick Chen

Po-Yen Hsu

Hsiu-Han Liao

Koying Huang

Julie Huang

The disclosure describes a syndrome decoder circuit including: a syndrome computation circuit configured to receive K bits of message bits and P bits of parity bits to calculate S bits of syndrome bits; a X bits weight correction circuit configured to receive multiple sets of first number of bits of the syndrome bits and a first digits of the K bits of message bits to generate a first set of correction masks for the first digits of K bits of message bits; and a X−1 bits weight correction circuit configured to receive multiple sets of second number of bits of the syndrome bits and a second digits of the K bits of message bits to generate a second set of correction masks for the second digits of K bits of message bits. The first number is not equal to the second number.

Syndrome decoder circuit

A monotonic counter memory system including a counter circuit and a memory circuit is provided. The counter circuit is configured to increase a count by one in response to a clock signal and output a count value of n bits, where n is a positive integer. The memory circuit includes a plurality of memory cells. The memory circuit is configured to store the count value. The stored count value changes one bit at each input count of the clock signal, and a bit switching time of the stored count value are smaller than 2−1 times.

Monotonic counter memory system

A resistive memory apparatus including bit lines, word lines, a memory array, bypass paths, select circuits, and a switch circuit is provided. The word lines are respectively crossed with the bit lines. The memory array includes memory elements. One end of each of the memory elements is coupled to the corresponding word line, and another end of each of the memory elements is coupled between a first node and a second node on the corresponding bit line. Each of the bypass paths is connected in parallel with the corresponding bit line between the first node point and the second node. Each of the select circuits is coupled to the corresponding bit line and bypass path, and configured to select the coupled bit line or bypass path. The switch circuit is coupled to the word lines, and configured to select one of the word lines.

Resistive memory apparatus

An in-memory computing apparatus and a computing method thereof are provided. A memory array includes a shifted weight storage area that stores shifted weight values, a shift information storage area that stores the number of shift units, and a shift unit amount storage area that stores a shift unit amount. A shift restoration circuit restores a weight shift amount of a shifted sum-of-products according to the number of shift units of the shifted weight values and a column shift unit amount, so as to generate multiple restored sum-of-products.

In-memory computing apparatus and computing method having a memory array includes a shifted weight storage, shift information storage and shift restoration circuit to restore a weigh shifted amount of shifted sum-of-products to generate multiple restored sum-of-products

A write cycle recording device includes a storage device and a controller. The storage device is corresponding to a memory block of a non-volatile memory. The storage device has a plurality of bits for recording a plurality of recorded writing loop counts corresponding to a plurality of writing operations of the memory block. The controller is configured to: perform a writing operation on the memory block; record a performed writing loop count of the writing operation; and, update a recorded writing loop count corresponding to the writing operation in the storage device according to the performed writing loop count.

Non-volatile memory and write cycle recording device thereof

A memory structure and an operation method are provided. The memory structure comprises a memory array, having plural blocks, each of the blocks having plural word lines coupled to memory cells; and one marker bit column having one or plural marker bit units, and the one plural marker bit units being coupled to one or the plural word lines. In performing a block erase operation to the blocks of the memory array, for each block, the controller pre-reads the data from the marker bit unit is pre-read, and the marker bit unit is erased during performing the block erase operation if the marker bit indicates a program state, and the block erase operation is skipped if the marker bit indicates an erase state.

Memory structure with marker bit and operation method thereof

A memory device and a multiple cells error correction in a memory cell is provided. The memory device includes a plurality of memory cells and a memory control circuit. Each of the memory cells includes a first type physical cell and a second type physical cell. The memory control circuit is coupled to each of the memory cells. The memory control circuit writes a writing data into the first type physical cell and verifies the data stored in the first type physical cell is same as the writing data or not. The writing data is set and processed by performing a write operation. The memory control circuit writes the writing data into the second type physical cell when the data stored in the first type physical cell is not same as the writing data.

Memory device and multi physical cells error correction method thereof

A memory storage device including a memory storage array and a memory controller is provided. The memory storage array is configured to store data. The memory controller is coupled to the memory storage array. The memory controller is configured to write to-be-written data to the memory storage array. The to-be-written data includes a plurality of data bits and a flip bit. The memory controller performs a verification operation on the to-be-written data to determine whether the data bits includes error bits and records information of the error bits. The memory controller, determines, according to a quantity of the error bits, whether to invert parities of the data bits and the flip bit, and records the parity of the flip bit. In addition, a data access method is also provided.

Memory storage device and data access method

An interface control circuit includes an interface wrapper, a logic circuit, a multiplexer and a command decoder. The interface wrapper transceives a plurality of first signals in a first interface, converts the first signals to a plurality of second signals in a second interface, and generates at least one first command signal according to the first signals. The logic circuit receives the second signals, and generates a second command signal according to the second signals. The multiplexer receives the first command signal and the second command signal, and generates a third command signal according to the first command signal and the second command signal. The command decoder receives the third command signal and generates the decoded command according to the third command signal.

Integrated circuit and interface control circuit thereof

A non-volatile memory device includes a first memory cell array, a first error correction code (ECC) decoder and a controller. The first memory cell array is divided into a first sub-array and a second sub-array by a first address boundary. The first ECC decoder is coupled to the first memory cell array, performs an ECC operation on read-out data from first memory cell array. The controller is coupled to the first memory cell array and the first ECC decoder, adjusts the first address boundary according to a first ECC failure bit number.

Non-volatile memory device

The invention provides a data accessing method for a memory apparatus. The data accessing method includes: performing a reading operation on the memory apparatus based on an address information to obtain a codeword and an indicator, where the indicator corresponds to the codeword; enabling a first error correction code (ECC) operation or second ECC operation to be operated on the codeword for generating an error corrected data, wherein, the first ECC operation corrects less bits than the second ECC operation.

Memory apparatus and data accessing method thereof

The disclosure is directed to a memory storage apparatus having a dynamic data repair mechanism. The memory storage apparatus includes a connection interface; a memory array; and a memory control circuit configured at least to: receive, from the connection interface, a write command which includes a user data and an address of the user data; encode the user data as a codeword which includes the user data and parity bits; write the codeword, in a first memory location of the memory array, as a written codeword; perform a read procedure of the written codeword to determine whether the written codeword is erroneously written; and store a redundant codeword of the user data in a second memory location in response to having determined that the written codeword is erroneously written.

Memory storage apparatus with dynamic data repair mechanism and method of dynamic data repair thereof

An encoding method for a memory storage apparatus adopting an ECC algorithm is provided. The memory storage apparatus comprises an ECC encoder. The encoding method includes: receiving a write command comprising a write address and a write data; reading an existing codeword; attaching a flip bit to the write data; encoding the write data and the flip bit to generate parity bits based on the ECC algorithm by the ECC encoder and attaching the write data and the flip bit to the plurality of parity bits to generate a new codeword; flipping the new codeword based on a number of bits among selected bits required to be changed from the existing codeword to the new codeword; and writing one of the new codeword and the flipped new codeword to the write address. In addition, a memory storage apparatus using the encoding method is provided.

Encoding method and memory storage apparatus using the same

The codeword accessing method including: receiving a write data with M message bits; generating parity information with N-M bits based on an error correction algorithm and the M message bits, where N and M are positive integers; transforming the M message bits and the parity information to a scrambled codeword with N bits by a scrambling operation, where the scrambled codeword contains only a part of the M message bits; and writing the scrambled codeword into a memory device.

Error correction code memory device and codeword accessing method thereof

A resistive memory with a self-termination control function and a self-termination control method for a resistive memory are provided. At least one memory cell comprises a cell transistor and a resistive element. A termination switch coupled to a source line terminates a write operation according to a comparison result. The comparator compares a voltage of a source line node with a reference voltage to output the comparison result, wherein the source line node is between the at least one memory cell and the termination switch, and the voltage of the source line node responses to the resistance of the resistive element. The variable resistance circuit provides an effective resistance according to a target resistance of the resistive element and outputs a reference current. The reference voltage node is coupled to the variable resistance circuit and the comparator and receives the reference current to provide the reference voltage to the comparator.

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San Jose, CA, United States of America

Chi-Shun Lin