University of Macau

Chi-Hang Chan

Rui Paulo Da Silva Martins

Seng-Pan U

Sai-Weng Sin

Yan Zhu

Franco Maloberti

U-Fat Chio

He-Gong Wei

Li Ding

A sampling front-end for analog to digital converter is presented that shares a high speed N-bit ADC at front-end and interleaves the pipelined residue amplification with shared amplifier, which achieves high speed, low power and compact area with high density capacitive DAC structure.

Sampling front-end for analog to digital converter

A comparator is provided and the comparator includes a comparing input unit and a latching unit. Wherein, the comparing input unit has a first input receiving a first comparing signal and has a second input receiving a second comparing signal. The comparing input unit drives a first intermediate node signal at a first intermediate node depending on the first comparing signal according to a first strobe signal, and the comparing input unit drives a second intermediate node signal at a second intermediate node depending on the second comparing signal according to the first strobe signal. The latching unit determines a comparing result according to at least one of the first intermediate node signal and the second intermediate node signal. In addition, the latching unit latches the comparing result according to a second strobe signal.

Comparator and calibration thereof

The present invention provides a pipelined-successive approximation register (SAR) analog-to-digital converter (ADC) circuit with decoupled flip-around MDAC, capacitive attenuation solution and self-embedded offset cancellation. The flip-around MDAC architecture is built for low inter-stage gain implementation. A capacitive attenuation solution is provided for minimizing the power dissipation and optimizing conversion speed. The design reuses SAR ADC to perform offset cancellation, which significantly saves calibration area, power and time.

Analog to digital converter circuit

An analog-to-digital converter (ADC) circuit comprising two time-interleaved successive approximation register (SAR) ADCs. Each of the two time-interleaved SAR ADCs comprises a first stage SAR sub-ADC, a residue amplifier, a second stage SAR sub-ADC and a digital error correction logic. The residue amplifier is shared between the time-interleaved paths, has a reduced gain and operates in sub-threshold to achieve power effective design.

Time-interleaved pipelined-SAR analog to digital converter with low power consumption

The present invention provides an n-bits successive approximation register (SAR) analog-to-digital converting (ADC) circuit, comprising: an n-bits SAR control logic, a p-type capacitor network including a DACarray and a sampling capacitor C, an n-type capacitor network including a DACarray and a sampling capacitor C; and a comparator for comparing outputs from the p-type capacitor network and the n-type capacitor network, wherein a power supply and ground are directly connected to the p-type capacitor network and the n-type capacitor network without using reference voltages produced by a reference voltage generator. The n-bits SAR control logic comprises n shift registers, n bit registers, and a switching logic. The comparator comprises a first pre-amplifier, a second pre-amplifier and a dynamic latch. Alternative, the comparator comprises a four-input pre-amplifier and a dynamic latch.

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Macau, China

Chi-Hang Chan