Industrial Technology Research Institute

Chi-Chun Hsu

Li-Ren Huang

Chun-Yen Wu

Po-Sen Huang

Wen-Dar Hsieh

A processor capable of changing redundant processing node comprises a plurality of processing nodes and a plurality of comparators. The plurality of processing nodes comprises a first processing node, a second processing node, and a third processing node, wherein the first processing node performs a first computation, the second processing node selectively performs the first computation or a second computation, and the third processing node performs the second computation. The plurality of comparators comprises a first comparator and a second comparator, wherein the first comparator connects to the first and second processing nodes to compare whether the results of the first computation performed by the first and second processing nodes are identical, and the second comparator connects to the second and third processing nodes to compare whether results of the second computation performed by the second and third processing nodes are identical.

Redundant processing node changing method and processor capable of changing redundant processing node

A testing method for a chip with an embedded non-volatile memory and the chip is provided. A remapping circuit and the non-volatile memory are connected to a processor. The non-volatile memory has a test area and an area under test. The test area stores a test program, and the area under test stores data under test. When the processor tests the chip, the processor outputs an original instruction address, and the remapping circuit remaps the original instruction address to generate a remapped instruction address. The processor reads the test program in the test area, and executes the test program to read the data under test in the area under test and to perform a test of toggling the logic circuit.

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Taipei, Taiwan

Chi-Chun Hsu