University of Utah Research Foundation

Chet Lo

Cynthia Furse

You Chung Chung

Shang Wu

Non-contact reflectometry for testing a signal path is described. The technique includes using capacitive coupling to inject a test signal into the signal path and extract a response signal from the signal path. Reflectometry techniques are used to determine characteristics of the signal path from the response signal. The technique is compatible with performing testing of a signal path carrying an operational signal.

Non-contact reflectometry system and method

A method and apparatus for mapping a wire network is disclosed. The method includes obtaining a reflectometry test signal of the wire network. An estimated network impulse response is estimated from the reflectometry response. A wire network model is then initialized, and iteratively improved by simulating an impulse response of the wire network model and adjusting the wire network model to reduce differences between the simulated impulse response and estimated network impulse response.

Wire network mapping method and apparatus using impulse responses

A technique for testing a signal path while an operational signal is present is disclosed. The technique may be performed without injecting a test signal into the signal path by using an operational signal already present in the signal path. A method of testing a signal path includes receiving an operational signal from the signal path and estimating a correlation of the operational signal. A system for testing a signal path includes an extractor configured to extract a sample of the operational signal when coupled to a signal path and a correlator configured to estimate a correlation of the operational signal. Various properties of the signal path may be determined using the technique.

Method and system for testing a signal path having an operational signal

The invention includes an apparatus and method for testing an electronic signal path. The apparatus includes a signal generator () configured to inject a test signal into the electronic signal path at an injection point when coupled to the signal path. The apparatus further includes a detector () coupled to the signal generator and configured to receive a combined signal at the injection point when coupled to the electronic signal path and determine an autocorrelation of the combined signal. The apparatus further includes an analyzer coupled to the detector and configured to determine a characteristic of the electronic signal path from the autocorrelation. The method includes injecting () a test signal into the electronic signal path an injection point, receiving () a combined signal from the electronic signal path at the injection point, determining () an autocorrelation of the combined signal, and estimating () a characteristic of the electronic signal path from the autocorrelation.

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Salt Lake City, UT, United States of America

Chet Lo