Texas Instruments Corporation

Chenwei J Yin

Louis J Izzi

William Robert Krenik

Jerry R Van Aken

Karl M Guttag

Richard D Simpson

Jeffrey L Nye

Edison H Chiu

Henry T Yung

Carrell R Killebrew, Jr

Mike Asal

Richard C Nail

An integrated circuit including a semiconductor chip and chip circuitry including memory circuitry and additional non-memory circuitry all fabricated on the semiconductor chip. The chip circuitry has a defined set of locations having logic states including a first logic state and at least one other logic state. A semiconductor chip package has pins connected to the chip circuitry. Accumulator circuitry on-chip and connected to the chip circuitry generates a count of the number of locations in the set that have the first logic state. The semiconductor chip package has pins connected to the chip circuitry and accumulator circuitry for external access to the count. Other integrated circuits, palette devices, computer graphics systems and methods are disclosed.

Test circuits and methods for integrated circuit having memory and

Test circuitry (90) is provided which includes a multiplexer (118) for selectively receiving multiple bit control words defining test functions to be executed by said test circuitry and for outputting data from said test circuitry. A plurality of digital data inputs (96) are provided for receiving multiple bit words of digital data and a plurality of analog data inputs (98) are provided for receiving analog data. A register (120) is coupled to multiplexer (118) for storing a one of the multiple bit words received by multiplexer (118). Control circuitry (122) is coupled to register (120) for controlling execution of the test function defined by the control word being held in register (120). First test circuitry (112) is coupled to digital data inputs (96) and control circuitry (122) for passing digital data words received at digital data inputs (96) to multiplexer (118) for output in response to a first control word of said control words being held in register (120).

Test circuitry, systems and methods

An integrated circuit includes read/write memory and non-memory circuitry. A detector generates a count of the number of bits of each data words recalled from the memory having a predetermined logic state. An adder accumulates the count for plural data words over a period of time into a count register. The integrated circuit may be tested by lading each data word of the read/write memory with a first logic state and repeatedly addressing said read/write memory circuitry with a predetermined number of each possible address in sequence. The resulting count in the count register is compared with an expected count. The integrated circuit may also be tested by loading a predetermined addressable storage location with another logic state while loading all other addressable storage locations with the first logic state and repeatedly addressing the predetermined addressable storage location. The resulting count in the count register is compared with another expected count. The non-memory circuitry is preferably digital to analog converters, whose outputs may be compared to test their operation.

Test circuits and method for integrated circuit having memory and

A circuit 83, 97 is provided for selectively interpreting data received in a format selected from the big-endian and little-endian formats to an other one of the big-endian and little-endian formats and includes an array of j sequentially ordered data input terminals for receiving a j-bit word of data formatted in a preselected one of the big-endian and little-endian formats. An array of j sequentially ordered first AND gates 126 is provided, each first AND gate 126 having first and second input ports and an output port, the first input port of the n.sup.th first AND gate 126 coupled to the n.sup.th one of the input terminals, the second input ports of the first AND gates 126 coupled to a control signal. An array of j sequentially ordered second AND gates 128 are provided, and each second AND gate 128 having first and second input ports and an output port, of the first input port of an n.sup.th one of the second AND gates 128 coupled to a (j-n+1).sup.th one of the first input terminals, the second input ports of the second AND gates 128 are coupled to a second control. An array of j sequentially ordered OR gates 130 are provided each having first and second input ports and an output port, the first input port of an m.sup.th one of the OR gates 130 being coupled to the output of an m.sup.th one of the first AND gate 126, the second input port of an n.sup.th one of the OR gates 130 coupled to the output of the n.sup.th one of the second AND gates 128. Wherein j is a consonant, n is a variable between 1 and j, and m is a variable between 1 and j.

Flexible graphics interface device switch selectable big and little

An integrated circuit including a semiconductor chip and chip circuitry including memory circuitry and additional non-memory circuitry all fabricated on the semiconductor chip. The chip circuitry has a defined set of locations having logic states including a first logic state and at least one other logic state. A semiconductor chip package has pins connected to the chip circuitry. Accumulator circuitry on-chip and connected to the chip circuitry generates a count of the the number of locations in the set that have the first logic state. The semiconductor chip package has pins connected to the chip circuitry and accumulator circuitry for external access to the count. Other integrated circuits, palette devices, computer graphics systems and methods are disclosed.

Internal test circuits for color palette device

A color palette selects a master clock from plural clock signals received at clock input terminals in response to a master clock selection control word received at control data terminals. A circuit forms a plurality of divided down clock signals from selected divide ratios of the master clock. A circuit selects a shift clock from among the divided down clock signals in response to at least some bits of an output clock selection control word received at the control data terminals. A circuit selectively enables and disables the shift clock in response to blanking data. A circuit selects a video clock from among the divided down clock signals in response to at least some bits of the output clock selection control word. A circuit synchronizes multiple bit words of color code received at color code input terminals with the master clock. A circuit outputs at least one memory recall address in response to receiving each multiple bit word of color code. A circuit stores color data words in a plurality of data storage locations, having associated memory recall addresses, and outputs a color data word upon receipt of an associated memory recall address. A circuit selectively writes color data words into these plural locations. A circuit synchronizes video control signals received at video control terminals with the master clock and provides the blanking data. A circuit selects for output between said color data words and true color data words received at said color code input terminals.

Video interface palette, systems and method

A color palette is provided having a plurality input terminals for receiving a plurality of bits of data having an order. A two color path is included which comprises first circuitry coupled to the input terminals for selectively reversing the order of the plurality of bits of data. Second circuitry is coupled to the first circuitry and is operable in a first mode to pass all of the plurality of bits of data received from the first circuitry and in a second mode has at least one word comprising selected ones of the plurality of bits, the selected ones of the bits having a bit order. The third circuitry is provided coupled to the second circuitry and operable to pass all of the bits of data received from the second circuitry in the first mode and operable to selectively reverse the ordering of the selected ones of the bits and pass be at least one word received from the second circuitry in the second mode. The fourth circuitry is further provided coupled to the third circuitry inoperable to receive bits of data passed from the circuitry and select for output as at least one word of true color data at least some of the bits.

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Richardson, TX, United States of America

Chenwei J Yin