Seagate Technology Incorporated

ChengYi Guo

Xiong Liu

Teck Khoon Lim

Lihong Zhang

Clifford Jayson Bringas Camalig

Mui Chong Chai

Teck Hoon Chua

Tim Rausch

Mehmet Fatih Erden

Quan Li

Quinn Jay Haddock

Richard Edward Martin

Song Wee Teo

TeckKhoon Lim

Antonia Tsoukatos

Jui Jing Lim

Gan Swee Chuan

Prasanna Manja Ramakrishna

Morovat Bryan Tayefeh

Swee Chuan Samuel Gan

Benjamin W Parish

Sai Sian Hon

Victor Chew Weng Khin

Lim TeckKhoon

TeckHoon Chua

HtayNwe Aung

Sheng Yuan Lin

KangHai Lim

A method for testing and grading electronic devices includes receiving a set of testing data associated with an electronic device that is following a testing routine. Based on the set of testing data, the method includes computing a first performance metric of the electronic device by using a first artificial neural network and computing a second performance metric of the electronic device by using a second artificial neural network. Based on at least the first predicted performance metric and the second predicted performance metric, the method includes computing a grade for the electronic device.

Methods, devices, and systems for reducing device test time

A disc drive includes a data storage surface having a system data zone and a user data zone, and a head that communicates with the data storage surface. The disc drive also includes a control circuit communicatively coupled to the head. The control circuit is configured to, during power up initialization of the disc drive, apply a fly height control value to direct the head to fly at a first target fly height for reading system data from the system data zone. The first target fly height is substantially higher than a second target fly height for reading user data from the user data zone. The control circuit determines whether an actual fly height of the head is substantially equal to the first target fly height. The control circuit performs fly height correction when the actual fly height is not substantially equal to the first target fly height.

Preventing data storage device failure due to changes in head fly height

A method includes receiving a first set of testing data associated with a first group of electronic devices. The first set of testing data is generated during a tuning test applying a first range of testing parameters. The method further includes receiving a second set of testing data associated with the first group of electronic devices. Further, the method includes determining, based on the first set of testing data and the second set of testing data, a second range of testing parameters that is less than the first range of testing parameters. The method includes testing a second group of electronic devices using a tuning test applying the second range of testing parameters.

Methods and devices for reducing device test time

A method is disclosed for establishing a fly height parameter for a hard disc drive. The method includes receiving a set of testing data associated with the hard disc drive and subjecting the hard disc drive to a fly-height test at a first, nominal temperature to generate fly-height data. Based on the set of testing data and the fly-height data, the method includes predicting the hard disc drive's fly-height data for a fly-height test at a second temperature different from the first, nominal temperature. The method further includes establishing the fly-height parameter for the hard disc drive in response to the fly-height data and the predicted fly-height data.

Methods, devices, and systems for establishing fly-height parameters for hard disk drives

A method for performing a flaw scan test on a hard disk drive is disclosed. The hard disk drive includes a magnetic recording medium and spindle motor associated with a predetermined rated speed. The method includes writing a test pattern to the magnetic recording medium while operating the spindle motor at a speed greater than the predetermined rated speed. The method also includes reading the test pattern at the greater speed and detecting flaws in response to reading the test pattern.

High rpm hard disk drive testing

Apparatus and method for proactively cleaning a data storage surface subjected to a mechanical disturbance. In some embodiments, data access commands are serviced by a data storage device to transfer user data between a host device and a rotatable data recording surface using a radially moveable data transducer. A media cleaning operation is scheduled and performed in response to the detection of a mechanical disturbance event externally applied to the data storage device. The media cleaning operation involves sweeping the data transducer across the data recording surface from a first radius to a second radius over a selected time duration. The entirety of the data recording surface is swept if sufficient time is available between pending commands to maintain a desired host data transfer rate. Otherwise, a partial cleaning operation is scheduled in which portions of the recording surface are successively cleaned between the servicing of the pending commands.

Adaptive cleaning of a media surface responsive to a mechanical disturbance event

Calibration and calculation of thermal clearance compensation of a head in a storage device without causing contact between the head and a storage medium. The thermal clearance compensation may be configured to compensate for any changing fly height of the head of the storage device during different temperature conditions based on high and low temperature signal data.

Non-contact fly height calibration and compensation

A method, computer-readable medium, and storage device for detecting and compensating for a change in MR-offset in a disk-based storage device. A pattern is written to a track on a disk of the storage device utilizing a read/write head. The read channel of the storage device is then configured as a harmonic sensor and the pattern is read from the track at a specific off-track position of the read/write head. The magnitude of the harmonic sensor is measured during the read, and the change in MR-offset is calculated for the read/write head based on the measured magnitude value and a predetermined transfer function between off-track amount and harmonic sensor magnitude. The change in MR-offset may then be utilized by a servo mechanism of the storage device to correct head positioning during a write operation for the read/write head.

MR-offset change detection and compensation

Testing and compensating for fly height of a head in a storage device during settling time using a head for use on a storage medium and a processor to idle the head for an idle time, unload the head from idle, and compensate for any unsettled fly height of the head using the idle time and at least a pre-determined clearance settling function over time from idle.

Head fly height testing and compensation

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ChengYi Guo