Siliconware Precision Industries Co., Ltd.

Other

Cheng-Tsai Hsieh

Kuan-Ta Chen

Bo-Siang Fang

Ying-Wei Lu

Chia-Chu Lai

Cheng-Shao Chen

Po-Wen Hsiao

Wen-Chin Liang

Provided is a testing method including: disposing a wafer on a working platform of a testing device; and moving a circuit board of the testing device relative to the working platform by a movement assembly of the testing device so as to allow at least two testing ports of the circuit board to test two chips of the wafer, respectively. Further, the two testing ports have different testing functions. Therefore, during the wafer testing process, a single testing device can perform multiple testing operations.

Testing device and method

An automated antenna testing device is disclosed. A carrying stand for objects-to-be-tested to be carried thereon, and an antenna stand corresponding to the carrying stand are installed in a receiving space of a cavity part on a machine part, and a conveyance device for moving the objects-to-be-tested to the carrying stand is installed on the machine part. The conveyance device and the cavity part are installed independently, therefore, an OTA testing environment can be prevented from being affected by external factors.

Automated antenna testing device

A testing system includes: a bilinear polarized antenna for receiving and dividing a circularly polarized radio wave associating with a horizontal and a vertical polarization path of an object-to-be-tested into a first and a second high frequency signal; a phase retarder for delaying a phase of the first high frequency signal by 90 degrees to form a first high frequency signal with a phase delay of 90 degrees; a power splitter for receiving or synthesizing the first high frequency signal with the phase delay of 90 degrees and the second high frequency signal; and a high frequency signal transceiver for measuring power of the first high frequency signal with the phase delay of 90 degrees and the second high frequency signal and determining states of the horizontal and vertical polarization paths of the object-to-be-tested based on the power. Therefore, the testing system can speed up testing of the object-to-be-tested.

Test system

A testing fixture used in an antenna testing process is provided. A cover unit having a second antenna portion is arranged on a base unit configured for an electronic structure having a first antenna portion to be placed thereon. The cover unit includes a non-metal interposing portion configured for pressing the electronic structure to separate the second antenna portion from the first antenna portion. Therefore, when the antenna testing process is performed on the electronic structure, a metal shielding effect is avoided, and an over the air testing environment is provided.

Growing community of inventors

Taichung, Taiwan

Cheng-Tsai Hsieh