Macronix International Co., Ltd.

Cheng Ming Yih

Chun-Hsiung Hung

Su-Chueh Lo

Yi-Fan Chang

Kuen-Long Chang

Jian Shing Liu

Ken Hui Chen

Kuen Long Chang

Kuo Yu Liao

Ta Kang Chu

Chu Ching Wu

Various discussed approaches include an improved grouping of edge word lines and center word lines of an erase group during erase verify and erase sub-operations of an erase operation. In another approach, changed voltage levels of edge word lines to address the over-erase issue of the erase group, and also improve erase time performance. Another approach uses dummy word lines.

Method and apparatus of performing an erase operation on a memory integrated circuit

Various discussed approaches improve the over erase issue and the coupling effect, and include (A) multilevel contacts between (i) the first outer selected word line of an erase group, and (ii) the first unselected word line outside the ease group neighboring the first outer selected word line; (B) a sufficient separation distance between (i) the first outer selected word line of an erase group, and (ii) the first unselected word line outside the ease group neighboring the first outer selected word line. These are examples of electrically isolating (i) the first outer selected word line of an erase group, from (ii) the first unselected word line outside the ease group neighboring the first outer selected word line.

Growing community of inventors

Hsinchu, Taiwan

Cheng Ming Yih