Chroma Ate Inc.

Cheng-Hung Pan

Mao-Sheng Liu

Min-Hung Chang

Chin-Yuan Chang

Ching-Lin Lee

Tzu-Tu Chao

Herein disclosed are a method and a test probe for testing an electrical component. The electrical component comprises at least a first electrode and a second electrode. The method comprises the following steps: covering the first electrode with a first conducting flexible layer; driving a first electrode contact to electrically connect a first end of the first electrode contact with the first electrode via the first conducting flexible layer; covering the second electrode with a second conducting flexible layer; and driving a second electrode contact to electrically connect a second end of the second electrode contact with the second electrode via the second conducting flexible layer. The first conducting flexible layer is an anisotropic conductive film.

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Taoyuan, Taiwan

Cheng-Hung Pan