Inotera Memories, Inc.

Silego Technology Inc.

Via Technologies, Inc.

Cheng-Hao Chen

Yun-Zong Tian

Yij Chieh Chu

Chun Chi Chen

Wei Jun Chen

Jay Li

Jozef Froniewski

Shih Chang Kao

Yinn-Jang Wu

Yi Feng Lee

Hyunbae Kim

Jo-Chieh Ma

Hyuntak Shin

Shih-Chang Kao

Smart USB plug detection is disclosed. In some embodiments, a battery charger identification chip includes circuitry configured to determine whether an external USB device has been plugged into a USB port of an associated system while the system is in a sleep mode and includes a pin configured to output a control signal indicating whether an external USB device is plugged into the system, wherein when an external USB device is plugged into the system the control signal facilitates powering on a current limit switch that is otherwise powered off during the sleep mode and wherein the current limit switch facilitates regulated delivery of current to the plugged in external USB device.

Smart USB plug detection

A capacitive coupling based sensor is disclosed. In some embodiments, a sensor comprises a transmitter and a receiver that are configured to be capacitively coupled when a coupling condition is satisfied as well as a circuit configured to determine whether a received signal that is received by the receiver matches a transmitted signal that is transmitted by the transmitter.

Capacitive coupling based sensor

A specification establishing method for controlling semiconductor process, the steps includes: sampling a plurality of sample groups from a population, each sample group being a non-normal distribution; filtering the sample groups; summarizing the filtered sample groups to form a non-normal distribution diagram; getting a value-at-risk and a median by calculating from the non-normal distribution diagram; getting a critical value by calculating the value-at-risk and the median with a critical formula; getting a plurality of state values by calculating the filtered sample groups with a proportion formula; and getting an index value by calculating the non-normal distribution diagram with the proportion formula. Thus, the state values indicate the states of the sample groups are abnormal or not by comparing the state values to the index value.

Specification establishing method for controlling semiconductor process

A method for assessing data worth for analyzing yield rate includes: getting measured data with data points that corresponds to control variables of semiconductor manufacturing; transforming the data points into a distance matrix with matrix distances corresponding to differences of the data points under the control variables; expressing sample differences recorded in the distance matrix by two-dimension vectors and calculating similarity degrees of the two-dimension vectors and the distance matrix so as to take loss information as a conversion error value; calculating discriminant ability of the transformed two-dimension data and expressing the discriminant ability by an error rate of discriminant; and taking the conversion error value and the error rate of discriminant as penalty terms and calculating a quality score corresponding to the measured data. Thereby, before analyzing the yield rate of semiconductor manufacturing, analysts can determine whether data includes information affecting the yield rate based on the quality score.

Method for assessing data worth for analyzing yield rate

A method of adjusting wafer process sequence includes steps of collecting production parameters for a plurality of lots; selecting a plurality of key parameters from the production parameters, wherein the key parameters at least includes a processing sequence; defining a formula to obtain an epsilon value; categorizing the lots into groups according to the epsilon value and the minimum point number by using density-based spatial clustering of application with noise (DBSCAN); and adjusting the processing sequences of the lots in the groups. Thereby, the lots with the same process recipe can be continuously or simultaneously sent into a machine, thereby reducing replacement of process recipes or shortening machine idle time.

Method of adjusting wafer processing sequence

For generating a simulation case to verify an operation of an IC device, a database including a plurality of device description files, a plurality of pattern files and a plurality of command files is established. Files stored in the database and corresponding to an IC device are collected. The collected files are parsed to find out entries to be edited. Specified entries are edited by a user according to the operation of the IC device. A simulation case or a plurality of simulation cases are generated according to the entries.

Growing community of inventors

Taipei, Taiwan

Cheng-Hao Chen