North University of China

Cheng Dong

Jun Liu

Yunbo Shi

Jun Tang

Zongmin Ma

Huanfei Wen

Hao Guo

Xiaoming Zhang

Huiyun Wang

Jun Xu

Jiuyan Wei

A system of automatic adjustment of a laser reflection path, comprising a central processing device, a driving device, a four-quadrant photodetector, a driving arm, a micro cantilever, a sample, a sample placing table, a light reflector, a laser, a CCD equipped with an optical microscope, a vibration sensor, a signal processing circuit, a display device, a storage device, and a control device; a system of automatic adjustment of the laser reflection path is controlled by the control device, wherein a laser beam is emitted by the laser, an image collected by the CCD equipped with the optical microscope is processed by the central processing device to identify the micro cantilever, and then a driving arm is driven by a driving device to drive the micro cantilever to move to the center of a laser spot, during which vibration signals of the driving arm are also under monitoring.

System of automatic adjustment of laser reflection path

A system for simultaneously and microscopically measuring vapor cell coating film energy transfer and relaxation characteristics at nanometer scales includes a space relaxation characteristic detection unit which includes a laser, an optical isolator, a spatial light filter, a reflector, a Glan-Taylor polarizer, a first quarter-wave plate, a spatial light modulator, a focusing lens, a second quarter-wave plate, a polarizing film, a PD detection unit, an I/V amplification unit, a data acquisition unit, a spectroscope and an optical chopper, an atomic force microscope detection unit for energy transfer micro-areas, a shielding cylinder, a coated alkali metal atomic vapor cell, a data processing unit and a magnetic field controlled coil. The energy transfer micro-area detection unit includes coated samples, a probe, an oscillator, a laser, a four-quadrant photoelectric detection unit, a band-pass filter unit, an automatic gain controller, an adder, a piezoelectric scanning cylinder, a sample table and a PI controller.

System for simultaneously and microscopically measuring vapor cell coating film energy transfer and relaxation characteristics at nanometer scales

Growing community of inventors

Taiyuan, China

Cheng Dong