Macronix International Co., Ltd.

Chen-Yuan Lin

Cheng-Chi Lin

Shih-Chin Lien

Ching-Lin Chan

Shyi-Yuan Wu

Chieh-Chih Chen

Wing-Chor Chan

Li-Fan Chen

A semiconductor structure and a method for forming the same are provided. The semiconductor structure comprises a first doped region, a second doped region, a doped strip and a top doped region. The first doped region has a first type conductivity. The second doped region is formed in the first doped region and has a second type conductivity opposite to the first type conductivity. The doped strip is formed in the first doped region and has the second type conductivity. The top doped region is formed in the doped strip and has the first type conductivity. The top doped region has a first sidewall and a second sidewall opposite to the first sidewall. The doped strip is extended beyond the first sidewall or the second sidewall.

Semiconductor structure and method for forming the same

A semiconductor device and a manufacturing method and an operating method for the same are provided. The semiconductor device comprises a substrate, a deep well, a first well, a first doped electrode region, a second doped electrode region and a high voltage threshold voltage channel region. The substrate has a first type conductivity. The deep well is formed in the substrate and has a second type conductivity opposite to the first conductivity. The first well is formed in the deep well and has at least one of the first type conductivity and the second type conductivity. The first and the second doped electrode regions are formed in the first well. The second doped electrode is adjacent to the first doped electrode and has the second conductivity. The high voltage threshold voltage channel region is formed in the first well and extending down from the surface of the substrate.

Semiconductor device and manufacturing method and operating method for the same

A method of manufacturing a semiconductor structure with a high voltage area and a low voltage area is provided. The method includes the following steps: providing a substrate of a first conductivity type; forming a second doped region of a second conductivity type in the substrate by a first implantation; forming a first doped region of a first conductivity type in the second doped region by a second implantation; forming an insulating layer on the substrate; forming a resistor on the insulating layer, wherein the resistor is electrically connecting the high voltage area and the low voltage area; and forming a conductor electrically connected to the resistor. The step of forming a first doped region defines the high voltage area and the low voltage area.

Method of manufacturing semiconductor structure

An improved semiconductor is provided whereby n-grade and the p-top layers are defined by a series of discretely placed n-type and p-type diffusion segments. Also provided are methods for fabricating such a semiconductor.

Methods of manufacturing a semiconductor device having varying p-top and n-grade regions

A semiconductor structure and a method for manufacturing the same are provided. The semiconductor structure comprises a first doped region, a second doped region, and a gate structure. The first doped region has a first type conductivity. The second doped region is formed in the first doped region and has a second type conductivity opposite to the first type conductivity. The gate structure is formed on the first doped region and the second doped region. The gate structure comprises a first gate portion and a second gate portion, which are separated from each other by a gap.

Semiconductor structure and method for manufacturing the same

Semiconductor device having varying p-top and n-grade regions

An ultra-high voltage n-type-metal-oxide-semiconductor (UHV NMOS) device with improved performance and methods of manufacturing the same are provided. The UHV NMOS includes a substrate of P-type material; a first high-voltage N-well (HVNW) region disposed in a portion of the substrate; a source and bulk p-well (PW) adjacent to one side of the first HVNW region, and the source and bulk PW comprising a source and a bulk; a gate extended from the source and bulk PW to a portion of the first HVNW region, and a drain disposed within another portion of the first HVNW region that is opposite to the gate; a P-Top layer disposed within the first HVNW region, the P-Top layer positioned between the drain and the source and bulk PW; and an n-type implant layer formed on the P-Top layer.

Ultra-high voltage N-type-metal-oxide-semiconductor (UHV NMOS) device and methods of manufacturing the same

A pattern for use in the manufacture of semiconductor devices is provided which, according to an example embodiment, may comprise at least one second field region comprising a main array of dies, each having a height of Yand a width of X, and the main array having a height of Y. The pattern according to the example embodiment may further include at least one first field region comprising a monitoring region having a height of Yand a width of Xand an auxiliary die region having a height of Yand comprising an auxiliary array of dies. The dimensions of the various regions may be proportional to one another, such that X=n&#xd7;X+adjustment, Y=n&#xd7;Y+adjustment, and Y=n&#xd7;Y+adjustment, n, n, and nbeing integers.

Pattern for ultra-high voltage semiconductor device manufacturing and process monitoring

A semiconductor structure with a high voltage area and a low voltage area includes a substrate of a first conductivity type accommodating the high voltage area and the low voltage area. A resistor is on the substrate, connecting the high voltage area and the low voltage area, and the resistor resides substantially in the high voltage area. The structure further includes a first doped region of the first conductivity type in the substrate between the high voltage area and the low voltage area, and a second doped region of a second conductivity type between the substrate and the first doped region. Moreover, an insulating layer is formed between the resistor and the first doped region.

Semiconductor structure and method of manufacturing the same

A lateral power MOSFET with a low specific on-resistance is described. Stacked P-top and N-grade regions in patterns of articulated circular arcs separate the source and drain of the transistor.

Lateral power MOSFET structure and method of manufacture

A semiconductor device comprising a high-voltage (HV) n-type metal oxide semiconductor (NMOS) embedded HV junction gate field-effect transistor (JFET) is provided. An HV NMOS with embedded HV JFET may include, according to a first example embodiment, a substrate, an N-type well region disposed adjacent to the substrate, a P-type well region disposed adjacent to the N-type well region, and first and second N+ doped regions disposed adjacent to the N-type well and on opposing sides of the P-type well region. The P-type well region may comprise a P+ doped region, a third N+ doped region and a gate structure, the third N+ doped region being interposed between the P+ doped region and the gate structure.

N-channel metal-oxide field effect transistor with embedded high voltage junction gate field-effect transistor

A high-voltage metal-oxide-semiconductor (HVMOS) device may include a source, a drain, a gate positioned proximate to the source, a drift region disposed substantially between the drain and a region of the gate and the source, and a self shielding region disposed proximate to the drain. A corresponding method is also provided.

High voltage MOS device and method for making the same

A semiconductor structure and a manufacturing method for the same are provided. The semiconductor structure includes a first doped well, a first doped electrode, a second doped electrode, doped strips and a doped top region. The doped strips are on the first doped well between the first doped electrode and the second doped electrode. The doped strips are separated from each other. The doped top region is on the doped strips and extended on the first doped well between the doped strips. The first doped well and the doped top region have a first conductivity type. The doped strips have a second conductivity type opposite to the first conductivity type.

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Taitung, Taiwan

Chen-Yuan Lin