Samsung Semiconductor Inc.

Chen Y Wang

Vani Vemulapalli

Jan P Karwowski

A laser fuse signature circuit for testing whether a fuse link in an IC has been disconnected includes a first series circuit connecting the power and ground pins and a second series circuit, including the fuse and a plurality of diode devices, connecting an input pin to a first node in the first series circuit. Transistors included in the first series circuit are connected so that the laser fuse signature circuit does not conduct current during normal operation or leakage current testing of the IC.

Zero power dissipation laser fuse signature circuit for redundancy in

The present invention uses two pairs of cross coupled n-channel sense amplifier transistors attached between two electrically balanced halves of a bit line. Disposed between each pair of cross coupled n-channel sense amplifier transistors is only one pair of p-channel restore transistors attached between the bit line and complement bit line. Furthermore, on the bit line and complement bit line, between one pair of cross coupled n-channel sense amplifier transistors and the pair of p-channel restore transistors, are depletion type isolating transistors that further isolate halves of the bit line and complement bit line.

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San Jose, CA, United States of America

Chen Y Wang