Mpi Corporation

Chen-Rui Wu

Tzu-Yang Chen

Che-Wei Lin

Chin-Yi Lin

Sheng-Yu Lin

Ming-Ta Hsu

Chia-Ju Wei

Probe for testing device under test

A probe head includes upper and lower die units, and a linear probe inserted therethrough and thereby defined with tail, body and head portions. A first bottom surface of the upper die unit and a second top surface of the lower die unit face each other, thereby defining an inner space wherein the body portion is located and includes a plurality of sections each having front width larger than or equal to back width, including a narrowest section whose upper and lower ends have a distance from the first bottom surface and the second top surface respectively. The head and tail portions are offset from each other along two horizontal axes and the body portion is thereby curved. The present invention is favorable in dynamic behavior control of the linear probe which is easy in manufacturing, lower in cost and has more variety in material.

Probe head with linear probe

Growing community of inventors

Chu-Pei, Taiwan

Chen-Rui Wu