Orient Semiconductor Electronics, Limited

Chen-Ping Su

Chia-Min Chuang

Chia-Yu Chen

En-Shou Chang

I-Chi Cheng

Ming-Lang Tsai

Ta-Lin Pong

Chon-Tsai Yang

A lead frame structure comprises a side rail, a first paddle, a second paddle, a plurality of leads, and an downset anchor bar. The first paddle is connected to the side rail via at least one first tie bar, and the second paddle is connected to the side rail via at least one-second tie bar. The first paddle and the second paddle separated from each other are used to define an area to support a chip. These leads set on the side rail expends toward to the chip supporting area. One end of the downset anchor bar is connected to the side rail, and the other end of the downset anchor bar has a protrusion portion which is between the first paddle and the second paddle and is downset from the side rail.

Lead frame structure and applications thereof

An inspection device for wiring of integrated circuit includes a base seat and an inspection cover, wherein the top end of the base seat is provided with cavity of appropriate depth and having supporting rib, and the two lateral sides of the cavity are provided with protruded edge a little higher than the cavity; the inspection cover having two side blocks is provided with an extended frame stripe such that the two side blocks and the two frame stripes are formed into a frame body, and corresponding stripes are formed between the two side blocks such that the corresponding stripes divides the frame body into a plurality of observation region, and each observation region is adapted for an inspection plate made from a transparent material, and the two side withholding seat of the inspection plate are located at the end face of the two side blocks, and the inspection plate moves along the end face of the two side blocks, whereby the base plate of the IC is positioned at the withholding protruded edge of the base seat and at the end face of the supporting stripe, then the inspection cap correspondingly covers the base seat and the inspection plate is used to inspect the height of arch of the wiring of the integrated circuit.

Inspection device for wiring of an integrated circuit

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Kaohsiung, Taiwan

Chen-Ping Su