Advanced Micro Devices Corporation

Chen Pauling

Lee Edward Cleveland

Binh Quang Le

Michael Achter

A memory circuit arrangement for sensing current in a target cell during a read operation is disclosed. According to one exemplary embodiment, the memory circuit arrangement comprises the target cell and a first neighboring cell adjacent to the target cell. The first target cell has a first bit line connected to ground; the target cell also has a second bit line connected to a sensing circuit. The first neighboring cell shares the second bit line with the target cell; the first neighboring cell also has a third bit line connected to the sensing circuit during the read operation. The memory circuit arrangement results in increased error margins in a fast and accurate manner during the read operation of the target cell.

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Saratoga, CA, United States of America

Chen Pauling